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In situ investigation of localized corrosion of aluminum alloys in chloride solution using integrated EC-AFM/SECM techniques
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Pan, J
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机构: Royal Inst Technol, Dept Mat Sci & Engn, SE-10044 Stockholm, Sweden

Leygraf, C
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机构: Royal Inst Technol, Dept Mat Sci & Engn, SE-10044 Stockholm, Sweden

Norgren, S
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机构: Royal Inst Technol, Dept Mat Sci & Engn, SE-10044 Stockholm, Sweden
机构:
[1] Royal Inst Technol, Dept Mat Sci & Engn, SE-10044 Stockholm, Sweden
[2] Sapa Technol, SE-61281 Finspang, Sweden
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D O I:
10.1149/1.1911900
中图分类号:
O646 [电化学、电解、磁化学];
学科分类号:
081704 ;
摘要:
Scanning electrochemical microscopy (SECM) has been integrated with electrochemical atomic force microscopy (EC-AFM), and applied for in situ studies of localized corrosion of Al alloys in NaCl solution. The instrument utilizes a dual mode probe, which functions both as a normal cantilever and as an ultramicroelectrode. The I-/I-3(-) redox mediator was used for mapping of local electrochemical current. Concurrent topography and electrochemical activity maps have been obtained on the same surface area with micrometer lateral resolution. Preliminary results show ongoing localized dissolution related to intermetallic particles in the Al alloys, which may occur well below the breakdown potential. (c) 2005 The Electrochemical Society. All rights reserved.
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页码:B21 / B24
页数:4
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