Anomalous peaks in reflectance spectra of some GaAs substrates

被引：4

作者：

Engelbrecht, JAA

Hillie, KT

机构：

[1] Univ Port Elizabeth, Dept Phys, ZA-6000 Port Elizabeth, South Africa

[2] Univ Free State, Dept Phys, ZA-9300 Bloemfontein, South Africa

来源：

PHYSICA B-CONDENSED MATTER | 2003年 / 340卷

关键词：

infrared; reflectance; GaAs;

D O I：

10.1016/j.physb.2003.09.083

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

GaAs substrates of various planar orientations were characterized optically by measuring reflectance spectra as near-normal incidence. Anomalous peaks were observed in some spectra in the wavenumber range of 250-550 cm(-1) Several hypotheses for the origin of these peaks were suggested and investigated. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：320 / 323

页数：4

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