Influence of epitaxial properties on the mutual inductance response of high-quality YBCO thin films

被引：6

作者：

Lucia, ML

Santamaria, J

SanchezQuesada, F

Lopera, W

Gomez, ME

Prieto, P

机构：

[1] UNIV COMPLUTENSE MADRID,FAC CIENCIAS FIS,DEPT FIS APLICADA 3,E-28040 MADRID,SPAIN

[2] UNIV VALLE,DEPT FIS,THIN FILM GRP,CALI 25360,COLOMBIA

来源：

PHYSICA C | 1996年 / 260卷 / 1-2期

关键词：

D O I：

10.1016/0921-4534(96)00120-7

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

High-quality YBa2Cu3O7-x films have been produced on SrTiO3 (001) and NdGaO3 (001) substrates. X-ray Phi scans show a good in-plane texture but do not exclude the presence of domains at 90 degrees. Diamagnetic shielding properties obtained from mutual-inductance measurements show a double peak structure which may be ascribed to the presence of those domains. This point is further supported with an analysis of the normal-state resistivity. Films with an interdomain resistivity of 10(-5) Omega cm show a double peak structure in the mutual-inductance measurements and relatively low values of the critical current densities (1.5 x 10(5) A cm(-2) at 77 K), while films with interdomain resistivities lower than 10(-6) Omega cm show a narrow single peak and higher values of the critical current (10(6) A cm(-2) at 77 K).

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页码：149 / 155

页数：7

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