Characterization of traveling heater method (THM) grown Cd0.9Zn0.1Te crystals

被引：88

作者：

Chen, Henry ^{[1
]}

Awadalla, Salah A.

Mackenzie, Jason

Redden, Robert

Bindley, Glenn

Bolotnikov, A. E.

Camarda, G. S.

Carini, G.

机构：

[1] Redlen Technol, Sidney, BC V8L 5Y8, Canada

[2] Brookhaven Natl Lab, Upton, NY 11793 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2007年 / 54卷 / 04期

关键词：

CdZnTe; CZT; homeland security; medical; imaging; optical deep level transient spectroscopy (ODLTS); pixellated detectors; Te inclusion; traveling heater method;

D O I：

10.1109/TNS.2007.902369

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

High-performance semi-ingulating single crystals of n-type Cd0.9Zn0.1Te (CZT) were grown using the traveling heater method (THM). X-ray and gamma-ray detector configurations fabricated from this material have a room-temperature mean energy resolution of 4.3% FWHM for a Co-57 source (122 keV) and uniform pixel-to-pixel response on monolithic 20 x 20 x 5 mm(3) pixellated detectors. Energy resolution of < 1% FWHM for Cs-137 (662 keV) has been measured on virtual Frisch-grid 4 x 4 x 11 mm(3) devices useful for homeland security applications. Additional characterization techniques including mobility-lifetime measurements, infrared microscopy, X-ray topography, and OPTICAL Deep Level Transient Spectroscopy (ODLTS) have demonstrated the superior quality of this THM CZT.

引用

页码：811 / 816

页数：6

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