Diffraction-pattern calculation and phase identification of hypothetical crystalline C3N4

被引:40
作者
Wang, JB [1 ]
Lei, JL [1 ]
Wang, RH [1 ]
机构
[1] Wuhan Univ, Dept Phys, Wuhan 430072, Peoples R China
关键词
D O I
10.1103/PhysRevB.58.11890
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In the present work we calculate x-ray powder-diffraction patterns and structure factors for electron diffraction of seven structures of hypothetical crystalline C3N4. Applying the same computational method, we calculate the x-ray powder-diffraction patterns of beta-Si3N4 and alpha-Si3N4 that match the experimental ones taken from the Joint Committee on Powder Diffraction Standards cards indicating very well the reliability of our computational programs. The discrepancy between calculated diffraction intensities and the experimental ones from synthesized C-N compounds indicates that all the claims regarding successful synthesis of crystalline beta-C3N4, alpha-C3N4, and defect zinc blende C3N4 are not convincing, at least from the paint of view of phase identification by the diffraction method. All the calculated patterns can be used as standard reference patterns in the future synthesis of C3N4. [S0163-1829(98)00541-4].
引用
收藏
页码:11890 / 11895
页数:6
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