Electrical properties of Bi2-xSbxTe3 materials obtained by ultrarapid quenching

被引:13
作者
Koukharenko, E
Fréty, N
Shepelevich, VG
Tedenac, JC
机构
[1] Univ Montpellier 2, LPMC UMR 5617, F-34095 Montpellier 5, France
[2] Belarusian State Univ, Dept Phys, Minsk 220080, BELARUS
关键词
bismuth telluride; ultrarapid quenching; microstructure; thermoelectric properties;
D O I
10.1016/S0925-8388(01)00945-8
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Bismuth and antimony telluride alloys were prepared using the ultrarapid quenching process route. The electrical properties of these materials were then characterized by measuring the Seebeck coefficient, Hall coefficient and electrical resistivity. It appeared that the Bi2-xSbxTe3 materials changed from the n-type to the p-type at an x-value of about 0.7. For n-type materials, the Bi1.6Sb10.4Te3 foils (x=0.4) showed a maximal Seebeck coefficient with a value of -100 muV K-1. For p-type materials, a maximal Seebeck coefficient was observed for x-values varying from 1.2 to 1.6 with a value of 135 muV K-1. The evolutions of the Seebeck coefficient, electrical resistivity, Hall coefficient with temperature, from 77 to 300 K, showed the degenerate nature of the quenched materials. The evolution of the mobility with temperature indicated that the diffusion mechanism was mainly associated with acoustic phonon scattering. The study evidenced that the Bi,,,,Sb,,,,Te, alloy has optimal electrical properties with a carrier concentration of 3.2X10(19) cm(-3), a Hall mobility of 150 cm(2) V-1 s(-1) and a Seebeck coefficient of 225 muV.K-1 after annealing. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1 / 4
页数:4
相关论文
共 16 条
[11]  
IVANOVA LD, 1995, IAN SSSR NEORG MATER, V31, P735
[12]   Microstructural study of Bi2Te3 material obtained by ultrarapid quenching process route [J].
Koukharenko, E ;
Fréty, N ;
Nabias, G ;
Shepelevich, VG ;
Tedenac, JC .
JOURNAL OF CRYSTAL GROWTH, 2000, 209 (04) :773-778
[13]  
Miroshnichenko I.S., 1982, QUENCHING LIQUID STA, P162
[14]  
OHTA T, 1994, P 4 C SAN PET, P24
[15]  
ROWE DM, 1983, MODERN THERMOELECTRI, P103
[16]   ELECTRICAL PROPERTIES OF POLYCRYSTALLINE SILICON FILMS [J].
SETO, JYW .
JOURNAL OF APPLIED PHYSICS, 1975, 46 (12) :5247-5254