High field effects in solid dielectrics

被引:41
作者
Boggs, S [1 ]
Huang, JB
机构
[1] Univ Connecticut, Elect Insulat Res Ctr, Storrs, CT 06269 USA
[2] Univ Toronto, Dept Elect Engn, Toronto, ON, Canada
关键词
solid dielectrics; electrical treeing; high electric fields; conductivity;
D O I
10.1109/57.730802
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The reliability of high voltage dielectrics is tied closely to high field effects, typically in microscopic volumes around defects such as asperities on a conductor, small cavities, etc.
引用
收藏
页码:5 / 12
页数:8
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