solid dielectrics;
electrical treeing;
high electric fields;
conductivity;
D O I:
10.1109/57.730802
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
The reliability of high voltage dielectrics is tied closely to high field effects, typically in microscopic volumes around defects such as asperities on a conductor, small cavities, etc.