Study of electrical properties of high- and medium-resistivity silicon detectors irradiated with very high neutron fluence

被引:4
作者
Biggeri, U
Borchi, E
Bruzzi, M
Li, Z
Verbitskaya, E
机构
[1] Brookhaven Natl Lab, Upton, NY 11973 USA
[2] Univ Florence, Dipartimento Energet, Firenze, Italy
[3] Ist Nazl Fis Nucl, I-50125 Firenze, Italy
[4] RAS, AF Ioffe Physicotech Inst, St Petersburg, Russia
关键词
D O I
10.1016/S0168-9002(97)01258-8
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Electrical properties of high (4-6 k Omega cm) and medium (1-1.5 k Omega cm) resistivity p(+)/n/n(+) silicon detectors irradiated with very high fluence neutrons, up to 4x10(15) neutrons/cm(2), have been studied. Some new results are presented and discussed. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:176 / 179
页数:4
相关论文
共 9 条
[1]   INTERSTITIAL DEFECT REACTIONS IN SILICON [J].
ASOM, MT ;
BENTON, JL ;
SAUER, R ;
KIMERLING, LC .
APPLIED PHYSICS LETTERS, 1987, 51 (04) :256-258
[2]   CV and Hall effect analysis on neutron irradiated silicon detectors [J].
Biggeri, U ;
Borchi, E ;
Bruzzi, M ;
Lazanu, S ;
Li, Z .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1997, 388 (03) :330-334
[3]   Hall effect measurements on proton-irradiated ROSE samples [J].
Biggeri, U ;
Borchi, E ;
Bruzzi, M ;
Pirollo, S ;
Sciortino, S ;
Lazanu, S ;
Li, Z .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1997, 400 (01) :113-123
[4]  
BIGGERI U, 1996, IN PRESS NUCL PHYS B
[5]   Long term instabilities in the defect assembly in irradiated high resistivity silicon detectors [J].
Eremin, V ;
Ivanov, A ;
Verbitskaya, E ;
Li, Z ;
Schmidt, B .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (03) :819-824
[6]  
FEICK H, 1997, 2 WORKSH RAD HARDN S
[7]   Direct observation and measurements of neutron-induced deep levels responsible for N-eff changes in high-resistivity silicon detectors using TCT [J].
Li, Z ;
Li, CJ ;
Eremin, V ;
Verbitskaya, E .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1997, 388 (03) :297-307
[8]   Microscopic analysis of defects in a high resistivity silicon detector irradiated to 1.7x10(15)n/cm(2) [J].
Li, Z ;
Ghislotti, G ;
Kraner, HW ;
Li, CJ ;
Nielsen, B ;
Feick, H ;
Lindstroem, G .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1996, 43 (03) :1590-1598
[9]  
LI Z, 1996, NUCL INSTRUM METH A, V377, P275