Optical and interferometric lithography - Nanotechnology enablers

被引:254
作者
Brueck, SRJ [1 ]
机构
[1] Univ New Mexico, Albuquerque, NM 87106 USA
关键词
epitaxy; interference; lithography; metamaterials; nanofluidics; nanomagnetics; nanophotonics; nanoscience; nanotechnology; negative-index materials;
D O I
10.1109/JPROC.2005.853538
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Interferometric lithography (IL), the interference of a small number of coherent optical beams, is a powerful technique for the fabrication of a wide array of samples of interest for nanoscience and nanotechnology. The techniques and limits of IL are discussed with particular attention to the smallest scales achievable. With immersion techniques, the smallest pattern size for a single exposure is a half-pitch of lambda/4n where lambda is the optical wavelength and n is the refractive index of the immersion material. Currently with a 193-nm excimer laser source and H2O immersion, this limiting dimension is similar to 34 nm. With nonlinear spatial frequency multiplication techniques, this limit is extended by factors of 112, 1/3, etc.-extending well into the nanoscale regime. IL provides an inexpensive, large-area capability as a result of its parallelism. Multiple exposures, multiple beams, and mix-and-match with other lithographies extend the range of applicability. Imaging IL provides an approach to arbitrary structures with comparable resolution. Numerous application areas, including nanoscale epitaxial growth for semiconductor heterostructures; nanofluidics for biological separations; nanomagnetics for increased storage density; nanophotonics including distributed feedback and distributed Bragg reflectors, two- and three-dimensional photonic crystals, metamaterials, and negative refractive index materials for enhanced optical interactions are briefly reviewed.
引用
收藏
页码:1704 / 1721
页数:18
相关论文
共 74 条
  • [1] CHARACTERISTICS OF RELIEF PHASE HOLOGRAMS RECORDED IN PHOTORESISTS
    BARTOLINI, RA
    [J]. APPLIED OPTICS, 1974, 13 (01) : 129 - 139
  • [2] USE OF PHOTORESIST AS A HOLOGRAPHIC RECORDING MEDIUM
    BEESLEY, MJ
    CASTLEDI.JG
    [J]. APPLIED OPTICS, 1970, 9 (12): : 2720 - &
  • [3] Simulation of the 45-nm half-pitch node with 193-nm immersion lithography - imaging interferometric lithography and dipole illumination
    Biswas, A
    Brueck, SRJ
    [J]. JOURNAL OF MICROLITHOGRAPHY MICROFABRICATION AND MICROSYSTEMS, 2004, 3 (01): : 35 - 43
  • [4] Single-longitudinal-mode emission from interband cascade DFB laser with a grating fabricated by interferometric lithography
    Bradshaw, JL
    Bruno, JD
    Pham, JT
    Wortman, DE
    Zhang, S
    Brueck, SRJ
    [J]. IEE PROCEEDINGS-OPTOELECTRONICS, 2003, 150 (04): : 288 - 292
  • [5] Extension of 193-nm immersion optical lithography to the 22-nm half-pitch node
    Brueck, SRJ
    Biswas, AM
    [J]. OPTICAL MICROLITHOGRAPHY XVII, PTS 1-3, 2004, 5377 : 1315 - 1322
  • [6] Spatial frequency analysis of optical lithography resolution enhancement techniques
    Brueck, SRJ
    Chen, XL
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (03): : 908 - 920
  • [7] BRUECK SRJ, 2002, INT TRENDS APPL OPTI, P85
  • [8] Measurement of the refractive index and thermo-optic coefficient of water near 193 nm
    Burnett, JH
    Kaplan, SG
    [J]. JOURNAL OF MICROLITHOGRAPHY MICROFABRICATION AND MICROSYSTEMS, 2004, 3 (01): : 68 - 72
  • [9] Formation of three-dimensional periodic microstructures by interference of four noncoplanar beams
    Cai, LZ
    Yang, XL
    Wang, YR
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2002, 19 (11): : 2238 - 2244
  • [10] Fabrication of photonic crystals for the visible spectrum by holographic lithography
    Campbell, M
    Sharp, DN
    Harrison, MT
    Denning, RG
    Turberfield, AJ
    [J]. NATURE, 2000, 404 (6773) : 53 - 56