Instrumental setup for high-throughput small- and wide-angle solution scattering at the X33 beamline of EMBL Hamburg

被引：63

作者：

Blanchet, Clement E. ^{[1
]}

Zozulya, Alexey V. ^{[1
]}

Kikhney, Alexey G. ^{[1
]}

Franke, Daniel ^{[1
]}

Konarev, Peter V. ^{[1
]}

Shang, Weifeng ^{[1
]}

Klaering, Robbert ^{[1
]}

Robrahn, Bernd ^{[1
]}

Hermes, Christoph ^{[1
]}

Cipriani, Florent ^{[2
]}

Svergun, Dmitri I. ^{[1
]}

Roessle, Manfred ^{[1
]}

机构：

[1] EMBL Hamburg, D-22603 Hamburg, Germany

[2] EMBL Grenoble, F-38042 Grenoble, France

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2012年 / 45卷

关键词：

SYNCHROTRON-RADIATION; CONTROL-SYSTEM; DIFFRACTION; DETECTOR;

D O I：

10.1107/S0021889812013490

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A setup is presented for automated high-throughput measurements of small-angle X-ray scattering (SAXS) from macromolecular solutions on the bending-magnet beamline X33 of EMBL at the storage ring DORIS-III (DESY, Hamburg). A new multi-cell compartment allows for rapid switching between in-vacuum and in-air operation, for digital camera assisted control of cell filling and for colour sample illumination. The beamline is equipped with a Pilatus 1 M-W pixel detector for SAXS and a Pilatus 300 k-W for wide-angle scattering (WAXS), and results from the use of the Pilatus detectors for scattering studies are reported. The setup provides a broad resolution range from 100 to 0.36 nm without the necessity of changing the sample-to-detector distance. A new optimized robotic sample changer is installed, permitting rapid and reliable automated sample loading and cell cleaning with a required sample volume of 40 ml. All the devices are fully integrated into the beamline control software system, ensuring fully automated and user-friendly operation (attended, unattended and remote) with a throughput of up to 15 measurements per hour.

引用

页码：489 / 495

页数：7

共 17 条

[11] X-RAY-DIFFRACTION AND SCATTERING ON DISORDERED-SYSTEMS USING SYNCHROTRON RADIATION [J].