Control of reactive sputtering processes

被引:299
作者
Sproul, WD
Christie, DJ
Carter, DC
机构
[1] React Sputtering Consulting LLC, Ft Collins, CO 80525 USA
[2] Adv Energy Ind Inc, Ft Collins, CO 80525 USA
关键词
reactive sputtering; partial pressure control; pulsed dc power; mid-ftequency ac power;
D O I
10.1016/j.tsf.2005.05.022
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The method of reactive gas control during reactive sputtering strongly influences the deposition rate and film properties of the compound being deposited. Flow control of the reactive gas is the simplest method, but since reactive sputtering is typically done in the compound or poisoned mode of the target, the deposition rate is low compared to the rate from the elemental target. In addition, the film properties produced by flow control reactive sputtering are less than optimal. Partial pressure control of the reactive gas is more complex than flow control because it requires active feedback control, but it allows operation of the process in the transition region between the elemental and poisoned states of the target. By operating in this region, higher deposition rates compared to flow control are achieved, and the film properties are improved. Reactive sputtering of insulating films requires the use of the right type of power to prevent arcing on the target, which is detrimental to the quality of the deposited films. Both pulsed dc and mid-frequency ac power prevent arcing during the reactive sputtering of insulating films. Arc prevention eliminates droplet ejection from the target and allows the reactive deposition to occur without large fluctuations in the reactive gas partial pressure, often a result of uncontrolled arcing. Ternary or quaternary compounds can be reactively sputtered using dual magnetron set-ups and multiple reactive gases. Multiple reactive gases present an additional control problem in that one of the reactive gases can trap the target in the poisoned mode unless the partial pressures of both reactive gases are individually controlled. Reactive sputtering with high power pulsed magnetron sputtering, which provides a high degree of ionization of the sputtered species, is possible for insulating films as long as the partial pressure of the reactive gas is controlled and arc detection and suppression is available on the power supply. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:1 / 17
页数:17
相关论文
共 53 条
[1]   MECHANISMS OF VOLTAGE-CONTROLLED, REACTIVE, PLANAR MAGNETRON SPUTTERING OF AL IN AR-N2 AND AR-O2 ATMOSPHERES [J].
AFFINITO, J ;
PARSONS, RR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1984, 2 (03) :1275-1284
[2]   HYSTERESIS EFFECTS IN THE SPUTTERING PROCESS USING 2 REACTIVE GASES [J].
BARANKOVA, H ;
BERG, S ;
CARLSSON, P ;
NENDER, C .
THIN SOLID FILMS, 1995, 260 (02) :181-186
[3]  
BARTOLOMEI LA, 1998, Patent No. 58491262
[4]  
BELKIND A, 2001, 44 ANN TECHN C P SVC, P130
[5]  
BURTON CH, 2002, Patent No. 6440280
[6]  
CARTER D, 2002, 45 ANN TECHN C P SOC, P570
[7]  
CARTER DC, 2004, 47 ANN TECHN C P SOC, P37
[8]  
CHRISTI DJ, 2003, 46 ANN TECHN C P SOC, P257
[9]  
Christie D.-J., 2003, 46 ANN TECHN C P SOC, P393
[10]  
Christie DJ, 2004, P 47 AMM SVC TECHN C, P113