Super-resolution imaging via spatiotemporal frequency shifting and coherent detection

被引:11
作者
Alekseyev, Leonid [1 ]
Narimanov, Evgenii [1 ]
Khurgin, Jacob [2 ]
机构
[1] Purdue Univ, Dept Elect & Comp Engn, W Lafayette, IN 47907 USA
[2] Johns Hopkins Univ, Dept Elect & Comp Engn, Baltimore, MD 21218 USA
来源
OPTICS EXPRESS | 2011年 / 19卷 / 22期
关键词
NEAR-FIELD; OPTICAL-SYSTEM; MICROSCOPY; HOLOGRAPHY;
D O I
10.1364/OE.19.022350
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Diffraction limit is manifested in the loss of high spatial frequency information that results from decay of evanescent waves. As a result, conventional far-field optics yields no information about an object's subwavelength features. Here we propose a novel approach to recovering evanescent waves in the far field, thereby enabling subwavelength-resolved imaging and spatial spectroscopy. Our approach relies on shifting the frequency and the wave vector of near-field components via scattering on acoustic phonons. This process effectively removes the spatial frequency cut-off for unambiguous far field detection. This technique can be adapted for digital holography, making it possible to perform phase-sensitive subwavelength imaging. We discuss the implementation of such a system in the mid-IR and THz bands, with possible extension to other spectral regions. (C) 2011 Optical Society of America
引用
收藏
页码:22350 / 22357
页数:8
相关论文
共 25 条
[1]   Synthetic aperture fourier holographic optical microscopy [J].
Alexandrov, Sergey A. ;
Hillman, Timothy R. ;
Gutzler, Thomas ;
Sampson, David D. .
PHYSICAL REVIEW LETTERS, 2006, 97 (16)
[2]  
[Anonymous], 2006, Nonlinear Optics
[3]   High-frequency surface acoustic wave devices based on AlN/diamond layered structure realized using e-beam lithography [J].
Assouar, M. B. ;
Elmazria, O. ;
Kirsch, P. ;
Alnot, P. ;
Mortet, V. ;
Tiusan, C. .
JOURNAL OF APPLIED PHYSICS, 2007, 101 (11)
[4]   Simultaneous amplitude-contrast and quantitative phase-contrast microscopy by numerical reconstruction of Fresnel off-axis holograms [J].
Cuche, E ;
Marquet, P ;
Depeursinge, C .
APPLIED OPTICS, 1999, 38 (34) :6994-7001
[5]   Pattern characterization of deep-ultraviolet photoresists by near-field infrared microscopy [J].
Dragnea, B ;
Preusser, J ;
Szarko, JM ;
Leone, SR ;
Hinsberg, WD .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (01) :142-152
[6]   Theory of the transmission properties of an optical far-field superlens for imaging beyond the diffraction limit [J].
Durant, Stephane ;
Liu, Zhaowei ;
Steele, Jennifer M. ;
Zhang, Xiang .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 2006, 23 (11) :2383-2392
[7]   DIGITAL IMAGE FORMATION FROM ELECTRONICALLY DETECTED HOLOGRAMS [J].
GOODMAN, JW ;
LAWRENCE, RW .
APPLIED PHYSICS LETTERS, 1967, 11 (03) :77-+
[8]   Nonlinear structured-illumination microscopy: Wide-field fluorescence imaging with theoretically unlimited resolution [J].
Gustafsson, MGL .
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2005, 102 (37) :13081-13086
[9]   Near-field probing of vibrational absorption for chemical microscopy [J].
Knoll, B ;
Keilmann, F .
NATURE, 1999, 399 (6732) :134-137
[10]  
Korpel A., 1989, ACOUSTOOPTICS