学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
Thickness dependence of refractive index for anodic aluminium oxide films
被引:15
作者
:
Chiu, RL
论文数:
0
引用数:
0
h-index:
0
机构:
NATL CHIAO TUNG UNIV, INST MAT SCI & ENGN, HSINCHU, TAIWAN
NATL CHIAO TUNG UNIV, INST MAT SCI & ENGN, HSINCHU, TAIWAN
Chiu, RL
[
1
]
Chang, PH
论文数:
0
引用数:
0
h-index:
0
机构:
NATL CHIAO TUNG UNIV, INST MAT SCI & ENGN, HSINCHU, TAIWAN
NATL CHIAO TUNG UNIV, INST MAT SCI & ENGN, HSINCHU, TAIWAN
Chang, PH
[
1
]
机构
:
[1]
NATL CHIAO TUNG UNIV, INST MAT SCI & ENGN, HSINCHU, TAIWAN
来源
:
JOURNAL OF MATERIALS SCIENCE LETTERS
|
1997年
/ 16卷
/ 02期
关键词
:
D O I
:
10.1023/A:1018518832762
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
[No abstract available]
引用
收藏
页码:174 / 178
页数:5
相关论文
共 36 条
[31]
EXAMINATION OF ALUMINUM COPPER-FILMS DURING ANODIC-OXIDATION .1. CORROSION STUDIES
[J].
STREHBLOW, HH
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
STREHBLOW, HH
;
DOHERTY, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
DOHERTY, CJ
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(01)
:30
-33
[32]
EXAMINATION OF ALUMINUM-COPPER FILMS DURING GALVANOSTATIC FORMATION OF ANODIC OXIDE .2. RUTHERFORD BACKSCATTERING AND DEPTH PROFILING
[J].
STREHBLOW, HH
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
STREHBLOW, HH
;
MELLIARSMITH, CM
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
MELLIARSMITH, CM
;
AUGUSTYNIAK, WM
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
AUGUSTYNIAK, WM
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(06)
:915
-919
[33]
A LARGE-AREA HIGH-RESOLUTION ACTIVE-MATRIX COLOR LCD ADDRESSED BY A-SI TFTS
[J].
SUNATA, T
论文数:
0
引用数:
0
h-index:
0
SUNATA, T
;
YUKAWA, T
论文数:
0
引用数:
0
h-index:
0
YUKAWA, T
;
MIYAKE, K
论文数:
0
引用数:
0
h-index:
0
MIYAKE, K
;
MATSUSHITA, Y
论文数:
0
引用数:
0
h-index:
0
MATSUSHITA, Y
;
MURAKAMI, Y
论文数:
0
引用数:
0
h-index:
0
MURAKAMI, Y
;
UGAI, Y
论文数:
0
引用数:
0
h-index:
0
UGAI, Y
;
TAMAMURA, J
论文数:
0
引用数:
0
h-index:
0
TAMAMURA, J
;
AOKI, S
论文数:
0
引用数:
0
h-index:
0
AOKI, S
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1986,
33
(08)
:1212
-1217
[34]
A COMPARATIVE-STUDY OF EVAPORATED AL2O3, SIO2 AND SIO2.AL2O3 THIN-FILMS
[J].
VANFLETEREN, J
论文数:
0
引用数:
0
h-index:
0
机构:
STATE UNIV GHENT,ELECTR LAB,B-9000 GHENT,BELGIUM
STATE UNIV GHENT,ELECTR LAB,B-9000 GHENT,BELGIUM
VANFLETEREN, J
;
VANCALSTER, A
论文数:
0
引用数:
0
h-index:
0
机构:
STATE UNIV GHENT,ELECTR LAB,B-9000 GHENT,BELGIUM
STATE UNIV GHENT,ELECTR LAB,B-9000 GHENT,BELGIUM
VANCALSTER, A
.
THIN SOLID FILMS,
1986,
139
(01)
:89
-94
[35]
YAMAMOTO H, 1960, 1990 IEEE IEDM, P851
[36]
DETERMINATION OF THE REFRACTIVE-INDEX OF POROUS ANODIC OXIDE-FILMS ON ALUMINUM BY A PHOTOLUMINESCENCE METHOD
[J].
ZEKOVIC, LD
论文数:
0
引用数:
0
h-index:
0
机构:
FAC SCI BELGRADE,DEPT PHYS,YU-11001 BELGRADE,YUGOSLAVIA
FAC SCI BELGRADE,DEPT PHYS,YU-11001 BELGRADE,YUGOSLAVIA
ZEKOVIC, LD
;
UROSEVIC, VV
论文数:
0
引用数:
0
h-index:
0
机构:
FAC SCI BELGRADE,DEPT PHYS,YU-11001 BELGRADE,YUGOSLAVIA
FAC SCI BELGRADE,DEPT PHYS,YU-11001 BELGRADE,YUGOSLAVIA
UROSEVIC, VV
;
JOVANIC, BR
论文数:
0
引用数:
0
h-index:
0
机构:
FAC SCI BELGRADE,DEPT PHYS,YU-11001 BELGRADE,YUGOSLAVIA
FAC SCI BELGRADE,DEPT PHYS,YU-11001 BELGRADE,YUGOSLAVIA
JOVANIC, BR
.
THIN SOLID FILMS,
1986,
139
(02)
:109
-113
←
1
2
3
4
→
共 36 条
[31]
EXAMINATION OF ALUMINUM COPPER-FILMS DURING ANODIC-OXIDATION .1. CORROSION STUDIES
[J].
STREHBLOW, HH
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
STREHBLOW, HH
;
DOHERTY, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
DOHERTY, CJ
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(01)
:30
-33
[32]
EXAMINATION OF ALUMINUM-COPPER FILMS DURING GALVANOSTATIC FORMATION OF ANODIC OXIDE .2. RUTHERFORD BACKSCATTERING AND DEPTH PROFILING
[J].
STREHBLOW, HH
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
STREHBLOW, HH
;
MELLIARSMITH, CM
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
MELLIARSMITH, CM
;
AUGUSTYNIAK, WM
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
AUGUSTYNIAK, WM
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(06)
:915
-919
[33]
A LARGE-AREA HIGH-RESOLUTION ACTIVE-MATRIX COLOR LCD ADDRESSED BY A-SI TFTS
[J].
SUNATA, T
论文数:
0
引用数:
0
h-index:
0
SUNATA, T
;
YUKAWA, T
论文数:
0
引用数:
0
h-index:
0
YUKAWA, T
;
MIYAKE, K
论文数:
0
引用数:
0
h-index:
0
MIYAKE, K
;
MATSUSHITA, Y
论文数:
0
引用数:
0
h-index:
0
MATSUSHITA, Y
;
MURAKAMI, Y
论文数:
0
引用数:
0
h-index:
0
MURAKAMI, Y
;
UGAI, Y
论文数:
0
引用数:
0
h-index:
0
UGAI, Y
;
TAMAMURA, J
论文数:
0
引用数:
0
h-index:
0
TAMAMURA, J
;
AOKI, S
论文数:
0
引用数:
0
h-index:
0
AOKI, S
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1986,
33
(08)
:1212
-1217
[34]
A COMPARATIVE-STUDY OF EVAPORATED AL2O3, SIO2 AND SIO2.AL2O3 THIN-FILMS
[J].
VANFLETEREN, J
论文数:
0
引用数:
0
h-index:
0
机构:
STATE UNIV GHENT,ELECTR LAB,B-9000 GHENT,BELGIUM
STATE UNIV GHENT,ELECTR LAB,B-9000 GHENT,BELGIUM
VANFLETEREN, J
;
VANCALSTER, A
论文数:
0
引用数:
0
h-index:
0
机构:
STATE UNIV GHENT,ELECTR LAB,B-9000 GHENT,BELGIUM
STATE UNIV GHENT,ELECTR LAB,B-9000 GHENT,BELGIUM
VANCALSTER, A
.
THIN SOLID FILMS,
1986,
139
(01)
:89
-94
[35]
YAMAMOTO H, 1960, 1990 IEEE IEDM, P851
[36]
DETERMINATION OF THE REFRACTIVE-INDEX OF POROUS ANODIC OXIDE-FILMS ON ALUMINUM BY A PHOTOLUMINESCENCE METHOD
[J].
ZEKOVIC, LD
论文数:
0
引用数:
0
h-index:
0
机构:
FAC SCI BELGRADE,DEPT PHYS,YU-11001 BELGRADE,YUGOSLAVIA
FAC SCI BELGRADE,DEPT PHYS,YU-11001 BELGRADE,YUGOSLAVIA
ZEKOVIC, LD
;
UROSEVIC, VV
论文数:
0
引用数:
0
h-index:
0
机构:
FAC SCI BELGRADE,DEPT PHYS,YU-11001 BELGRADE,YUGOSLAVIA
FAC SCI BELGRADE,DEPT PHYS,YU-11001 BELGRADE,YUGOSLAVIA
UROSEVIC, VV
;
JOVANIC, BR
论文数:
0
引用数:
0
h-index:
0
机构:
FAC SCI BELGRADE,DEPT PHYS,YU-11001 BELGRADE,YUGOSLAVIA
FAC SCI BELGRADE,DEPT PHYS,YU-11001 BELGRADE,YUGOSLAVIA
JOVANIC, BR
.
THIN SOLID FILMS,
1986,
139
(02)
:109
-113
←
1
2
3
4
→