Formation of AlN and GaN nanocolumns on Si(111) using molecular beam epitaxy with ammonia as a nitrogen source

被引:7
作者
Bertness, KA [1 ]
Roshko, A [1 ]
Sanford, NA [1 ]
Schlager, JB [1 ]
Gray, MH [1 ]
机构
[1] Natl Inst Stand & Technol, Boulder, CO 80305 USA
来源
PHYSICA STATUS SOLIDI C - CONFERENCES AND CRITICAL REVIEWS, VOL 2, NO 7 | 2005年 / 2卷 / 07期
关键词
D O I
10.1002/pssc.200461523
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have demonstrated growth of AlN and GaN nanocolumns using molecular beam epitaxy with ammonia as a nitrogen source. The appearance of the columnar structure is correlated with the use of a low-temperature AlN buffer layer, grown at about 650 degrees C. Field emission scanning electron microscopy (FESEM) and atomic force microscopy (AFM) indicate that the column diameters range from 12 to 30 nm. Layers were grown on Si(111) substrates with a variety of AlN buffer layer growth conditions. The AlN columns are distinct though tightly packed, and the tips of the columns are separated. Large, platelet-like protrusions are observed for low growth temperatures. Results from X-ray diffraction (XRD) and low-temperature photoluminescence (PL) are also discussed.
引用
收藏
页码:2369 / 2372
页数:4
相关论文
共 11 条
  • [1] Structural analysis of GaN layers with columnar structures grown by hydrogen-assisted ECR-MBE
    Araki, T
    Chiba, Y
    Nanishi, Y
    [J]. JOURNAL OF CRYSTAL GROWTH, 2000, 210 (1-3) : 162 - 166
  • [2] Optimization of the surface morphologies and electron mobilities in GaN grown by plasma-assisted molecular beam epitaxy
    Heying, B
    Smorchkova, I
    Poblenz, C
    Elsass, C
    Fini, P
    Den Baars, S
    Mishra, U
    Speck, JS
    [J]. APPLIED PHYSICS LETTERS, 2000, 77 (18) : 2885 - 2887
  • [3] Dislocation mediated surface morphology of GaN
    Heying, B
    Tarsa, EJ
    Elsass, CR
    Fini, P
    DenBaars, SP
    Speck, JS
    [J]. JOURNAL OF APPLIED PHYSICS, 1999, 85 (09) : 6470 - 6476
  • [4] Thermal stability of GaN on (111) Si substrate
    Ishikawa, H
    Yamamoto, K
    Egawa, T
    Soga, T
    Jimbo, T
    Umeno, M
    [J]. JOURNAL OF CRYSTAL GROWTH, 1998, 189 : 178 - 182
  • [5] In situ measurements of GaN nucleation layer decompostion
    Koleske, DD
    Coltrin, ME
    Allerman, AA
    Cross, KC
    Mitchell, CC
    Figiel, JJ
    [J]. APPLIED PHYSICS LETTERS, 2003, 82 (08) : 1170 - 1172
  • [6] Atomic arrangement at the AlN/Si(111) interface
    Liu, R
    Ponce, FA
    Dadgar, A
    Krost, A
    [J]. APPLIED PHYSICS LETTERS, 2003, 83 (05) : 860 - 862
  • [7] Structural properties and Raman measurement of AlN films grown on Si (111) by NH3-GSMBE
    Luo, MC
    Wang, XL
    Li, JM
    Liu, HX
    Wang, L
    Sun, DZ
    Zeng, YP
    Lin, LY
    [J]. JOURNAL OF CRYSTAL GROWTH, 2002, 244 (3-4) : 229 - 235
  • [8] Gas source molecular beam epitaxy of high quality AlxGa1-xN (0≤x≤1) on Si(111)
    Nikishin, S
    Kipshidze, G
    Kuryatkov, V
    Choi, K
    Gherasoiu, I
    de Peralta, LG
    Zubrilov, A
    Tretyakov, V
    Copeland, K
    Prokofyeva, T
    Holtz, M
    Asomoza, R
    Kudryavtsev, Y
    Temkin, H
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (04): : 1409 - 1412
  • [9] Analysis of MBE growth mode for GaN epilayers by RHEED
    Okumura, H
    Balakrishnan, K
    Hamaguchi, H
    Koizumi, T
    Chichibu, S
    Nakanishi, H
    Nagatomo, T
    Yoshida, S
    [J]. JOURNAL OF CRYSTAL GROWTH, 1998, 189 : 364 - 369
  • [10] Efficient stress relief in GaN heteroepitaxy on Si(111) using low-temperature AlN interlayers
    Reiher, A
    Bläsing, J
    Dadgar, A
    Diez, A
    Krost, A
    [J]. JOURNAL OF CRYSTAL GROWTH, 2003, 248 : 563 - 567