Elemental mapping of heterogeneous catalysts by energy-filtered transmission electron microscopy

被引：4

作者：

Crozier, PA

McCartney, MR

机构：

[1] Center for Solid State Science, Arizona State University, Tempe

来源：

JOURNAL OF CATALYSIS | 1996年 / 163卷 / 02期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1006/jcat.1996.0325

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A new technique for characterizing the distribution of elements on the nanometer scale over large areas is described for heterogeneous catalyst research. The method exploits recent developments in electron microscopy involving energy-filtered imaging and digital image recording. The new approach allows relatively large regions to be characterized in reasonable times. The technique is employed to study the elemental distribution in a NiCuCr catalyst. (C) 1996 Academic Press, Inc.

引用

页码：245 / 254

页数：10

共 24 条

[1] FILAMENTOUS CARBON GROWTH ON NICKEL-IRON SURFACES - THE EFFECT OF VARIOUS OXIDE ADDITIVES [J].

BAKER, RTK ;

CHLUDZINSKI, JJ .

JOURNAL OF CATALYSIS, 1980, 64 (02) :464-478

[2] INSITU ELECTRON-MICROSCOPY STUDIES OF CATALYST PARTICLE BEHAVIOR [J].

BAKER, RTK .

CATALYSIS REVIEWS-SCIENCE AND ENGINEERING, 1979, 19 (02) :161-209

[3] MEASUREMENT OF INELASTIC ELECTRON-SCATTERING CROSS-SECTIONS BY ELECTRON ENERGY-LOSS SPECTROSCOPY [J].

CROZIER, PA .

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1990, 61 (03) :311-336

[4] QUANTITATIVE ELEMENTAL MAPPING OF MATERIALS BY ENERGY-FILTERED IMAGING [J].

CROZIER, PA .

ULTRAMICROSCOPY, 1995, 58 (02) :157-174

[5] THE STUDY OF HETEROGENEOUS CATALYSTS BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY [J].

DATYE, AK ;

SMITH, DJ .

CATALYSIS REVIEWS-SCIENCE AND ENGINEERING, 1992, 34 (1-2) :129-178

[6] METHODS TO MEASURE PROPERTIES OF SLOW-SCAN CCD CAMERAS FOR ELECTRON DETECTION [J].

DERUIJTER, WJ ;

WEISS, JK .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (10) :4314-4321

[7] K-SHELL IONIZATION CROSS-SECTIONS FOR USE IN MICROANALYSIS [J].

EGERTON, RF .

ULTRAMICROSCOPY, 1979, 4 (02) :169-179

[8]

EGERTON RF, 1981, ULTRAMICROSCOPY, V6, P297, DOI 10.1016/S0304-3991(81)80166-0

[9]

EGERTON RF, 1978, ULTRAMICROSCOPY, V3, P242

[10]

EGERTON RF, 1986, ELECT EN LOSS SPECTR

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