MEASUREMENT OF INELASTIC ELECTRON-SCATTERING CROSS-SECTIONS BY ELECTRON ENERGY-LOSS SPECTROSCOPY

被引：45

作者：

CROZIER, PA ^{[1
]}

机构：

[1] UNIV ALBERTA,DEPT PHYS,EDMONTON T6G 2J1,ALBERTA,CANADA

来源：

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1990年 / 61卷 / 03期

关键词：

D O I：

10.1080/13642819008208637

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Absolute inelastic-electron-scattering cross-sections have been measured in solids at 100 keV from a range of elements in the periodic table. Total inelastic crosssections integrated over all atomic shells and inner-shell cross-sections have been determined. Comparison is made with previous experimental and theoretical data. © 1990 Taylor & Francis Ltd.

引用

页码：311 / 336

页数：26

共 53 条

[1] ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION
BISHOP, HE
RIVIERE, JC
[J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) : 1740 - &
[2] ELASTIC-SCATTERING IN EELS - FUNDAMENTAL CORRECTIONS TO QUANTIFICATION
BOURDILLON, AJ
STOBBS, WM
[J]. ULTRAMICROSCOPY, 1985, 17 (02) : 147 - 149
[3] BRUNGER W, 1965, Z PHYS, V124, P271
[4] CARPENTER RW, 1986, 44TH ANN P EL MICR S, P718
[5] MEASUREMENT OF FOIL THICKNESS AND EXTINCTION DISTANCE BY CONVERGENT BEAM TRANSMISSION ELECTRON-MICROSCOPY
CASTROFERNANDEZ, FR
SELLARS, CM
WHITEMAN, JA
[J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1985, 52 (03): : 289 - 303
[6] UNDERSTANDING THIN-FILM X-RAY-SPECTRA
CHAPMAN, JN
NICHOLSON, WAP
CROZIER, PA
[J]. JOURNAL OF MICROSCOPY-OXFORD, 1984, 136 (NOV): : 179 - 191
[7] DEADTIME CORRECTIONS FOR A PULSE COUNTING SYSTEM IN ELECTRON-ENERGY LOSS SPECTROSCOPY
CHENG, SC
CROZIER, PA
EGERTON, RF
[J]. JOURNAL OF MICROSCOPY-OXFORD, 1987, 148 : 285 - 288
[8] COLLIEX C, 1984, QUANTITATIVE ELECTRO, P149
[9] CORRECTING ELECTRON-ENERGY LOSS SPECTRA FOR ARTIFACTS INTRODUCED BY A SERIAL DATA-COLLECTION SYSTEM
CRAVEN, AJ
BUGGY, TW
[J]. JOURNAL OF MICROSCOPY-OXFORD, 1984, 136 (NOV): : 227 - 239
[10] MASS-THICKNESS DETERMINATION BY BETHE-SUM-RULE NORMALIZATION OF THE ELECTRON ENERGY-LOSS SPECTRUM
CROZIER, PA
EGERTON, RF
[J]. ULTRAMICROSCOPY, 1989, 27 (01) : 9 - 18

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