CORRECTING ELECTRON-ENERGY LOSS SPECTRA FOR ARTIFACTS INTRODUCED BY A SERIAL DATA-COLLECTION SYSTEM

被引：12

作者：

CRAVEN, AJ

BUGGY, TW

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1984年 / 136卷 / NOV期

关键词：

D O I：

10.1111/j.1365-2818.1984.tb00531.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：227 / 239

页数：13

共 15 条

[1] SINGLE-CRYSTAL OF YAG - NEW FAST SCINTILLATOR IN SEM [J].

AUTRATA, R ;

SCHAUER, P ;

KVAPIL, J ;

KVAPIL, J .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1978, 11 (07) :707-708

BROWNE, MT ;

WARD, JFL .

[3] DESIGN CONSIDERATIONS AND PERFORMANCE OF AN ANALYTICAL STEM [J].

CRAVEN, AJ ;

BUGGY, TW .

[4]

CRAVEN AJ, 1980, ELECTRON MICROSCOPY, V1, P170

[5]

EGERTON RF, 1981, 39TH P EMSA M BAT RO, P368

[6]

EGERTON RF, 1980, 38TH ANN P EMSA, P130

[7]

JOHNSON DE, 1981, 39TH P ANN M EL MICR, P370

[8]

JONES BL, 1982, ELECTRON MICROSCOPY, V1, P587

[9]

KIHN Y, 1980, ELECTRON MICROS, V4, P42

[10]

Krivanek O.L., 1981, QUANTITATIVE MICROAN, P136