DESIGN CONSIDERATIONS AND PERFORMANCE OF AN ANALYTICAL STEM

[1] BATSON PE, COMMUNICATION

[2] BURGE RE, 1980, SCANNING ELECTRON MI, V1, P81

[3] DIRECT DETERMINATION OF MAGNETIC DOMAIN-WALL PROFILES BY DIFFERENTIAL PHASE-CONTRAST ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1978, 3 (02) : 203 - 214

[4] IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1969, 15 (02) : 58 - &

[5] COWLEY JM, 1979, ULTRAMICROSCOPY, V3, P433

[6] CRAVEN AJ, 1977, I PHYS C SER, V36, P311

[7] CRAVEN AJ, 1980, ELECTRON MICROS, V3, P168

[8] CRAVEN AJ, UNPUBLISHED

[9] CRAVEN AJ, 1979, I PHYS C SER, V52, P47

[10] Crewe A. V., 1970, Optik, V30, P461

[1] BATSON PE, COMMUNICATION

[2] BURGE RE, 1980, SCANNING ELECTRON MI, V1, P81

[3] DIRECT DETERMINATION OF MAGNETIC DOMAIN-WALL PROFILES BY DIFFERENTIAL PHASE-CONTRAST ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1978, 3 (02) : 203 - 214

[4] IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1969, 15 (02) : 58 - &

[5] COWLEY JM, 1979, ULTRAMICROSCOPY, V3, P433

[6] CRAVEN AJ, 1977, I PHYS C SER, V36, P311

[7] CRAVEN AJ, 1980, ELECTRON MICROS, V3, P168

[8] CRAVEN AJ, UNPUBLISHED

[9] CRAVEN AJ, 1979, I PHYS C SER, V52, P47

[10] Crewe A. V., 1970, Optik, V30, P461