UNDERSTANDING THIN-FILM X-RAY-SPECTRA

被引：20

作者：

CHAPMAN, JN

NICHOLSON, WAP

CROZIER, PA

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1984年 / 136卷 / NOV期

关键词：

D O I：

10.1111/j.1365-2818.1984.tb00527.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

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页码：179 / 191

页数：13

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