共 7 条
- [1] FOIL THICKNESS MEASUREMENTS FROM CONVERGENT-BEAM DIFFRACTION PATTERNS - AN EXPERIMENTAL ASSESSMENT OF ERRORS [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1982, 46 (02): : 243 - 253
- [2] FOIL THICKNESS MEASUREMENTS FROM CONVERGENT-BEAM DIFFRACTION PATTERNS [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (02): : 325 - 335
- [3] BADDE HG, 1972, 5TH P EUR C EL, P440
- [4] BLAKE RG, 1978, PHILOS MAG A, V37, P1, DOI 10.1080/01418617808239158
- [5] ELECTRON DIFFRACTION STUDY OF MGO HOO SYSTEMATIC INTERACTIONS [J]. ACTA CRYSTALLOGRAPHICA, 1967, 22 : 14 - +
- [6] HIRSCH PB, 1965, ELECTRON MICROSCOPY
- [7] DETERMINATION OF FOIL THICKNESS BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPY [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 31 (02): : 771 - 780