MEASUREMENT OF FOIL THICKNESS AND EXTINCTION DISTANCE BY CONVERGENT BEAM TRANSMISSION ELECTRON-MICROSCOPY

被引：26

作者：

CASTROFERNANDEZ, FR

SELLARS, CM

WHITEMAN, JA

机构：

[1] Univ of Sheffield, Dep of, Metallurgy, Sheffield, Engl, Univ of Sheffield, Dep of Metallurgy, Sheffield, Engl

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1985年 / 52卷 / 03期

关键词：

D O I：

10.1080/01418618508237627

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：289 / 303

页数：15

共 7 条

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[2] FOIL THICKNESS MEASUREMENTS FROM CONVERGENT-BEAM DIFFRACTION PATTERNS
ALLEN, SM
[J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (02): : 325 - 335
[3] BADDE HG, 1972, 5TH P EUR C EL, P440
[4] BLAKE RG, 1978, PHILOS MAG A, V37, P1, DOI 10.1080/01418617808239158
[5] ELECTRON DIFFRACTION STUDY OF MGO HOO SYSTEMATIC INTERACTIONS
GOODMAN, P
LEHMPFUHL, G
[J]. ACTA CRYSTALLOGRAPHICA, 1967, 22 : 14 - +
[6] HIRSCH PB, 1965, ELECTRON MICROSCOPY
[7] DETERMINATION OF FOIL THICKNESS BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
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NAPIER, JG
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 31 (02): : 771 - 780