Oriented organic semiconductor thin films

被引：15

作者：

Andreev, A ^{[1
]}

Resel, R

Smilgies, DM

Hoppe, H

Matt, G

Sitter, H

Sariciftci, NS

Meissner, D

Plank, H

Zrzavecka, O

机构：

[1] Univ Linz, Inst Semicond & Solid State Phys, A-4040 Linz, Austria

[2] Graz Univ Technol, Inst Solid State Phys, A-8010 Graz, Austria

[3] Cornell Univ, CHESS G Line, Ithaca, NY 14853 USA

[4] Univ Linz, Inst Phys Chem, A-4040 Linz, Austria

[5] Univ Linz, LIOS, A-4040 Linz, Austria

[6] Masaryk Univ, Inst Condensed Matter Phys, Brno, Czech Republic

来源：

SYNTHETIC METALS | 2003年 / 138卷 / 1-2期

关键词：

organic epitaxy; crystalline thin films; atomic force microscopy; X-ray diffraction;

D O I：

10.1016/S0379-6779(03)00025-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this part of our investigations, we mainly use atomic force microscopy to study the growth of para-sexiphenyl (PSP) films on mica. It is shown that self-organization of PSP molecules occurs during the deposition controlled by the substrate temperature and deposition time. In addition, X-ray diffraction (XRD) measurements were performed using synchrotron radiation. They confirmed the very high crystalline quality of the grown films. (C) 2003 Elsevier Science B.V. All rights reserved.

引用

页码：59 / 63

页数：5

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