epitaxy;
single crystalline thin films;
oligomers;
atomic force microscopy;
D O I:
10.1016/S0379-6779(00)00966-8
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
We have used atomic force microscopy to investigate the structure of highly ordered para-sexiphenyl thin films grown by Hot Wall Epitaxy on mica. We have shown that the substrate temperature and the growth time are important parameters for control of the film morphology in terms of the degree of anisotropy and long range order.
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页码:1379 / 1380
页数:2
相关论文
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[1]
Andreev A, 2000, ADV MATER, V12, P629, DOI 10.1002/(SICI)1521-4095(200005)12:9<629::AID-ADMA629>3.3.CO