First commissioning results for the elliptically polarizing undulator beamline at the Advanced Light Source

被引：45

作者：

Young, AT ^{[1
]}

Feng, J ^{[1
]}

Arenholz, E ^{[1
]}

Padmore, HA ^{[1
]}

Henderson, T ^{[1
]}

Marks, S ^{[1
]}

Hoyer, E ^{[1
]}

Schlueter, R ^{[1
]}

Kortright, JB ^{[1
]}

Martynov, V ^{[1
]}

Steier, C ^{[1
]}

Portmann, G ^{[1
]}

机构：

[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source Div, Berkeley, CA 94720 USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2001年 / 467卷

关键词：

elliptically polarizing undulator; circular polarization; plane grating monochromator;

D O I：

10.1016/S0168-9002(01)00409-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new facility at the Advanced Light Source, Lawrence Berkeley National Laboratory, for high resolution magnetic spectroscopy is described. Beamline 4.0.2 has an elliptically polarizing undulator (EPU) and a high resolution monochromator, covering the energy range from 90 to 1800 eV. In this paper, we present the first commissioning results from this beamline, including measurements of the spectral resolution, photon flux and polarization of the x-rays. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：549 / 552

页数：4

共 10 条

[1]

CARR R, 1993, P SOC PHOTO-OPT INS, V2013, P56, DOI 10.1117/12.164806

[2] TUNABLE MULTILAYER EUV SOFT-X-RAY POLARIMETER [J].

KORTRIGHT, JB ;

RICE, M ;

FRANCK, KD .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (02) :1567-1569

[3] Elliptically polarizing undulator beamline 4.0.1 for magnetic spectroscopy at the advanced light source. [J].

Martynov, VV ;

Young, AT ;

Padmore, HA .

OPTICS FOR HIGH-BRIGHTNESS SYNCHROTRON RADIATION BEAMLINES II, 1996, 2856 :289-299

[4] THEORY OF CONDUCTING GRATINGS AND THEIR APPLICATIONS TO OPTICS [J].

NEVIERE, M ;

VINCENT, P ;

PETIT, R .

NOUVELLE REVUE D OPTIQUE, 1974, 5 (02) :65-77

[5]

NEVIERE M, 1980, PETIT ELECTROMAGNETI, V22

[6] THE PLANE GRATING AND ELLIPTICAL MIRROR - A NEW OPTICAL CONFIGURATION FOR MONOCHROMATORS [J].

PETERSEN, H .

OPTICS COMMUNICATIONS, 1982, 40 (06) :402-406

[7] A NEW UNDULATOR FOR GENERATING VARIABLY POLARIZED RADIATION [J].

SASAKI, S ;

MIYATA, K ;

TAKADA, T .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1992, 31 (12B) :L1794-L1796

[8] ANALYSES FOR A PLANAR VARIABLY-POLARIZING UNDULATOR [J].

SASAKI, S .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1994, 347 (1-3) :83-86

[9]

STEIER C, 2000, P 7 EUR PART ACC C V

[10] Magnetic high-resolution spectroscopy with Beamline 4.0.1-2: An elliptically polarizing undulator beamline at the Advanced Light Source [J].

Young, AT ;

Martynov, V ;

Padmore, HA .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1999, 101 :885-889

← 1 →