Effect of microscopic nonconservative process on noncontact atomic force microscopy

被引:90
作者
Sasaki, N
Tsukada, M
机构
[1] Univ Tokyo, Dept Mat Engn, Grad Sch Engn, Bunkyo Ku, Tokyo 1138656, Japan
[2] Japan Sci & Technol Corp, Core Res Evolut Sci & Technol, Tsukuba, Ibaraki 3050047, Japan
[3] Univ Tokyo, Grad Sch Sci, Dept Phys, Bunkyo Ku, Tokyo 1130033, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2000年 / 39卷 / 12B期
关键词
noncontact atomic-force microscopy; nonconservative process; frequency shift; Q value; power; dissipation; KBM method; tip-surface interaction;
D O I
10.1143/JJAP.39.L1334
中图分类号
O59 [应用物理学];
学科分类号
摘要
Effects of the tip-induced nonconservative processes of the tip or surface atom on the cantilever dynamics of noncontact atomic force microscopy (nc-AFM) are theoretically analyzed based on the time-averaging perturbation theory. The typical order of the magnitude of the Q value due to such nonconservative processes is estimated to be on the order of 10(4), which is comparable to the intrinsic dissipation of the cantilever free oscillation. The additional frequency shift due to the hysteresis loop of the force curve is estimated to be on the order of 10 Hz. This part of the frequency shift sets in like a step function when the tip turning point approaches the surface within a certain threshold height. This feature explains the experimental observation of the discontinuous frequency shift at chemical reactive sites.
引用
收藏
页码:L1334 / L1337
页数:4
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