S-parameter broad-band measurements on-microstrip and fast extraction of the substrate intrinsic properties

被引：20

作者：

Hinojosa, J ^{[1
]}

机构：

[1] Univ Politecn Cartagena, Dept Elect Tecnol Computadoras & Proyectos, Murcia, Spain

来源：

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 2001年 / 11卷 / 07期

关键词：

broad-band measurement; microstrip; permeability; permittivity; propagation; S-parameters;

D O I：

10.1109/7260.933779

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A broad-band technique for determining the electromagnetic properties of isotropic film-shaped materials, which uses a microstrip line, is presented. Complex permittivity and permeability are computed from analytical equations and S-parameter measurements of microstrip cells propagating the dominant mode, Measured epsilon (r) and mu (r) data for several materials are presented between 0.05 GHz and 40 GHz, This technique shows a good agreement between measured and predicted data.

引用

页码：305 / 307

页数：3

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