Assessment of insulated conductive cantilevers for biology and electrochemistry

被引:45
作者
Frederix, PLTM
Gullo, MR
Akiyama, T
Tonin, A
de Rooij, NF
Staufer, U
Engel, A [1 ]
机构
[1] Univ Basel, Biozentrum, ME Muller Inst Struct Biol, CH-4056 Basel, Switzerland
[2] Univ Neuchatel, Inst Microtechnol, CH-2007 Neuchatel, Switzerland
[3] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland
关键词
D O I
10.1088/0957-4484/16/8/001
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
This paper describes the characterization and application of electrically insulated conductive tips mounted on a cantilever for use in an atomic force microscope and operated in liquid. These multifunctional probes were microfabricated and designed for measurements on biological samples in buffer solution, but they can also be employed for electrochemical applications, in particular scanning electrochemical microscopy. The silicon nitride based cantilevers had a spring constant <= 0.1 N m(-1) and a conductive tip, which was insulated except at the apex. The conductive core of the tip consisted of a metal, e.g. platinum silicide, and exhibited a typical radius of 15 nm. The mechanical and electrical characterization of the probe is presented and discussed. First measurements on the hexagonally packed intermediate layer of Deinococcus radiodurans demonstrated the possibility to adjust the image contrast by applying a voltage between a support and the conductive tip and to measure variations of less than I pA in faradaic current with a lateral resolution of 7.8 nm.
引用
收藏
页码:997 / 1005
页数:9
相关论文
共 37 条
[1]  
Akiyama T, 2003, AIP CONF PROC, V696, P166, DOI 10.1063/1.1639691
[2]   Development of insulated conductive probes with platinum silicide tips for atomic force microscopy in cell biology [J].
Akiyama, T ;
Gullo, MR ;
de Rooij, NF ;
Tonin, A ;
Hidber, HR ;
Frederix, PLTM ;
Engel, A ;
Staufer, U .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2004, 43 (6B) :3865-3867
[3]   MICROFABRICATION OF CANTILEVER STYLI FOR THE ATOMIC FORCE MICROSCOPE [J].
ALBRECHT, TR ;
AKAMINE, S ;
CARVER, TE ;
QUATE, CF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3386-3396
[4]   SCANNING ELECTROCHEMICAL MICROSCOPY - INTRODUCTION AND PRINCIPLES [J].
BARD, AJ ;
FAN, FRF ;
KWAK, J ;
LEV, O .
ANALYTICAL CHEMISTRY, 1989, 61 (02) :132-138
[5]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[6]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[7]   MEASURING LOCAL SURFACE-CHARGE DENSITIES IN ELECTROLYTE-SOLUTIONS WITH A SCANNING FORCE MICROSCOPE [J].
BUTT, HJ .
BIOPHYSICAL JOURNAL, 1992, 63 (02) :578-582
[8]   SCAN SPEED LIMIT IN ATOMIC FORCE MICROSCOPY [J].
BUTT, HJ ;
SIEDLE, P ;
SEIFERT, K ;
FENDLER, K ;
SEEGER, T ;
BAMBERG, E ;
WEISENHORN, AL ;
GOLDIE, K ;
ENGEL, A .
JOURNAL OF MICROSCOPY-OXFORD, 1993, 169 :75-84
[9]  
Cussler E. L., 2009, DIFFUSION MASS TRANS
[10]   IMAGING CRYSTALS, POLYMERS, AND PROCESSES IN WATER WITH THE ATOMIC FORCE MICROSCOPE [J].
DRAKE, B ;
PRATER, CB ;
WEISENHORN, AL ;
GOULD, SAC ;
ALBRECHT, TR ;
QUATE, CF ;
CANNELL, DS ;
HANSMA, HG ;
HANSMA, PK .
SCIENCE, 1989, 243 (4898) :1586-1589