Development of insulated conductive probes with platinum silicide tips for atomic force microscopy in cell biology

被引:21
作者
Akiyama, T
Gullo, MR
de Rooij, NF
Tonin, A
Hidber, HR
Frederix, PLTM
Engel, A
Staufer, U
机构
[1] Univ Neuchatel, Inst Microtechnol, CH-2007 Neuchatel, Switzerland
[2] Univ Basel, Inst Phys, Basel, Switzerland
[3] Univ Basel, ME Muller Inst, Biozentrum, Basel, Switzerland
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2004年 / 43卷 / 6B期
关键词
AFM; conductive probe; membrane protein; microfabrication; tip;
D O I
10.1143/JJAP.43.3865
中图分类号
O59 [应用物理学];
学科分类号
摘要
A microfabrication process of a multifunctional probe is introduced for atomic force microscopy and various electrochemical measurements on biological samples in buffer solution. The silicon nitride probes have a spring constant lower than 0.1 N/m and a conductive tip, which is tightly insulated except at the apex. The conductive core of the tip consists of PtxSiy and shows a typical radius of curvature of 15 nm. A simultaneous measurement of topography and electrical current on graphite in air was demonstrated.
引用
收藏
页码:3865 / 3867
页数:3
相关论文
共 6 条
[1]   MICROFABRICATION OF CANTILEVER STYLI FOR THE ATOMIC FORCE MICROSCOPE [J].
ALBRECHT, TR ;
AKAMINE, S ;
CARVER, TE ;
QUATE, CF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3386-3396
[2]   IMAGING CRYSTALS, POLYMERS, AND PROCESSES IN WATER WITH THE ATOMIC FORCE MICROSCOPE [J].
DRAKE, B ;
PRATER, CB ;
WEISENHORN, AL ;
GOULD, SAC ;
ALBRECHT, TR ;
QUATE, CF ;
CANNELL, DS ;
HANSMA, HG ;
HANSMA, PK .
SCIENCE, 1989, 243 (4898) :1586-1589
[3]   Observing single biomolecules at work with the atomic force microscope [J].
Engel, A ;
Müller, DJ .
NATURE STRUCTURAL BIOLOGY, 2000, 7 (09) :715-718
[4]   Combined scanning electrochemical atomic force microscopy for tapping mode imaging [J].
Kueng, A ;
Kranz, C ;
Mizaikoff, B ;
Lugstein, A ;
Bertagnolli, E .
APPLIED PHYSICS LETTERS, 2003, 82 (10) :1592-1594
[5]   Calibration of rectangular atomic force microscope cantilevers [J].
Sader, JE ;
Chon, JWM ;
Mulvaney, P .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (10) :3967-3969
[6]   Development of a metal patterned cantilever for scanning capacitance microscopy and its application to the observation of semiconductor devices [J].
Yamamoto, T ;
Suzuki, Y ;
Miyashita, M ;
Sugimura, H ;
Nakagiri, N .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (04) :1547-1550