Observation of single- and double-stranded DNA using non-contact atomic force microscopy

被引：51

作者：

Maeda, Y ^{[1
]}

Matsumoto, T ^{[1
]}

Kawai, T ^{[1
]}

机构：

[1] Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 567, Japan

来源：

APPLIED SURFACE SCIENCE | 1999年 / 140卷 / 3-4期

关键词：

non-contact atomic force microscopy; ultrahigh vacuum; DNA; secondary structures;

D O I：

10.1016/S0169-4332(98)00562-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Non-contact atomic force microscopy (NC-AFM) has been applied to observe single- and double-stranded DNA. For the wet processes used to prepare the sample, a strong adhesion force at the surface is observed even in vacuum conditions. Despite the presence of this adhesion force, single- and double-stranded DNA images can be obtained by NC-AFM. Because of the high sensitivity of the tip-sample interaction, NC-AFM: images provide stronger contrast than tapping mode (TM)-AFM images. NC-AFM images reveal detailed structures of single- and double-stranded DNA which are not revealed by TM-AFM. Ln addition, several NC-AFM images show contrast artifacts, which might provide information on the detailed structure of DNA. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：400 / 405

页数：6

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