Measurement of curvature and twist of a deformed object by electronic speckle-shearing pattern interferometry

被引：28

作者：

Rastogi, PK

机构：

[1] Laboratory of Stress Analysis, Swiss Fed. Institute of Technology, 1015, Lausanne

来源：

OPTICS LETTERS | 1996年 / 21卷 / 12期

关键词：

D O I：

10.1364/OL.21.000905

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Electronic speckle-shearing pattern interferometry is applied to yield whole-field phase maps corresponding to the curvature and twist distributions of a deformed specimen. (C) 1996 Optical Society of America

引用

页码：905 / 907

页数：3

共 6 条

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SIROHI, RS .

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[6]

SIROHI PS, 1993, SPECKLE METROLOGY, P99

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