Partial dislocations in the X-ray topography of as-grown hexagonal silicon carbide crystals

Dislocations visible in X-ray topographs of as-grown hexagonal silicon carbide Lely platelets and physical vapor transport process wafers extinguished as if they had Burgers vectors of 1/3<11 (2)over bar0 >. Under the electron microscope, beneath the resolution of X-ray topography, short lengths of these dislocations were shown to consist of pairs of 1/3 < 10 (1) over bar0 > Shockley partials spanning narrow ribbons of stacking fault. An unusual example of a b = 1/3 < 11 (2) over bar0 > dislocation in a Lely platelet visibly separated into its partials in an X-ray topograph was presented. (C) 2001 Elsevier Science B.V. All rights reserved.