Advanced IGBT modules for railway traction applications: Reliability testing

被引：52

作者：

Berg, H

Wolfgang, E

机构：

[1] Eupec GmbH, D-59582 Warstein, Germany

[2] Siemens AG, Corp Technol, D-81730 Munich, Germany

来源：

MICROELECTRONICS RELIABILITY | 1998年 / 38卷 / 6-8期

关键词：

D O I：

10.1016/S0026-2714(98)00150-4

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

IGBT modules for railway traction applications have to be more intensively tested then those for industrial application. The paper describes the state of the art of already existing reliability test as well as a proposal for accelerated power cycling and temperature cycling tests. These tests are a result of the Brite EuRam research project RAPSDRA (reliability of advanced power semiconductor devices for railway traction application). (C) 1998 Published by Elsevier Science Ltd. All rights reserved.

引用

页码：1319 / 1323

页数：5