Fine structure at the X-ray absorption π* and σ* bands of amorphous carbon

被引:29
作者
Jiménez, I
Gago, R
Albella, JM
机构
[1] CSIC, Inst Ciencia & Tecnol Polimeros, E-28006 Madrid, Spain
[2] Forschungszentrum Rossendorf EV, Inst Ionenstrahlphys & Mat Forsch, D-01314 Dresden, Germany
[3] CSIC, Inst Ciencia Mat, E-28049 Madrid, Spain
基金
美国能源部;
关键词
amorphous carbon; X-ray absorption near edge spectroscopy; density of states; bonding structure;
D O I
10.1016/S0925-9635(03)00011-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
X-ray absorption near edge spectroscopy of amorphous carbon films shows a fine structure at the pi* and sigma* bands that is not present in the reference crystalline graphite and diamond materials. Thermal treatments of the amorphous carbon films in a vacuum induce clear changes in the fine structure, hence indicating that it is due to the presence of multiple bonding states. The intensity and energy position of the multiple pi* and sigma* states is directly correlated, confirming its origin as different bonding states Of sp(2) hybridized carbon atoms. The presence of the fine structure in amorphous carbon is interpreted as due to the presence of distorted trigonal and tetragonal bonding structures, in addition to the ideal hexagonal and cubic structures. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:110 / 115
页数:6
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