Young modulus, mechanical and electrical properties of isolated individual and bundled single-walled boron nitride nanotubes

被引：141

作者：

Arenal, Raul ^{[1
,2
]}

Wang, Ming-Sheng ^{[3
]}

Xu, Zhi ^{[3
]}

Loiseau, Annick ^{[1
]}

Golberg, Dmitri ^{[3
]}

机构：

[1] ONERA CNRS, LEM, F-92322 Chatillon, France

[2] Univ Zaragoza, INA, LMA, E-50018 Zaragoza, Spain

[3] Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton, Tsukuba, Ibaraki 3050044, Japan

来源：

NANOTECHNOLOGY | 2011年 / 22卷 / 26期

关键词：

ELASTIC-MODULUS; DEFORMATION;

D O I：

10.1088/0957-4484/22/26/265704

中图分类号：

TB3 [工程材料学];

学科分类号：

082905 [生物质能源与材料];

摘要：

The Young modulus of individual single-walled boron nitride nanotubes (SW-BNNTs) was determined using a high-resolution transmission-electron microscope (HRTEM)-atomic force microscope (AFM) set-up. The Young modulus and maximum stress for these NTs were deduced from the analysis of the stress-strain curves, and discussed as a function of the considered value for the shell thickness of an SW-BNNT. The elastic properties of bundles of SW-BNNTs were also investigated. All these experiments revealed that SW-BNNTs are very flexible. Furthermore, the electrical behavior of these SW-BNNTs was also analyzed employing a scanning tunneling microscope (STM) holder integrated with the same HRTEM. I/V curves were measured on individual tubes as well as on bundles of SW-BNNTs.

引用

页数：6

共 29 条

[1]

Determination of chiral indices of individual single- and double-walled boron nitride nanotubes by electron diffraction [J].