Scanning and transmission electron microscope investigation of preferential thinning during ion beam milling of an Al-Ag alloy containing γ precipitate plates and the subsequent effects on microanalysis

被引：9

作者：

Moore, KT ^{[1
]}

Howe, JM ^{[1
]}

Csontos, AA ^{[1
]}

机构：

[1] Univ Virginia, Dept Mat Sci & Engn, Charlottesville, VA 22903 USA

来源：

ULTRAMICROSCOPY | 1999年 / 76卷 / 04期

基金：

美国国家科学基金会;

关键词：

SEM; TEM; EFTEM; EDXS; ion-beam milling; Al-Ag alloy; precipitate;

D O I：

10.1016/S0304-3991(98)00081-3

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

This paper demonstrates how a combination of high-resolution field-emission gun scanning and transmission electron microscope (TEM) techniques, including bright-field TEM imaging, two-detector secondary electron imaging, energy-dispersive X-ray spectroscopy (EDXS) and energy-filtering transmission electron microscopy (EFTEM), can be used to unambiguously determine the degree of preferential thinning during ion beam milling of an Al alloy containing thin plate-shaped precipitates, and illustrates the problems incurred by differential thinning of specimens on EDXS data and EFTEM images. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：195 / 202

页数：8

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