Multivariate statistical analysis of FEG-STEM EDX spectra

被引：46

作者：

Titchmarsh, JM ^{[1
]}

Dumbill, S ^{[1
]}

机构：

[1] AEA TECHNOL, MAT PERFORMANCE DEPT, HARWELL LAB, DIDCOT, OXON, ENGLAND

来源：

JOURNAL OF MICROSCOPY | 1996年 / 184卷 / 184期

关键词：

principal component; factor analysis; STEM-EDX; segregation;

D O I：

10.1046/j.1365-2818.1996.1400698.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A multivariate statistical analysis method has been used to examine the information content of a series of EDX spectra acquired using a FEG-STEM recorded across a segregated grain boundary in a ferritic steel, The spectra have been factored into a set of orthogonal information components (eigenspectra), each of which corresponds to an independent source of information, Two meaningful eigenspectra are identified: one is related to the segregation of P and Cr and the other to a combination of self-absorption and coherent bremsstrahlung. Spectra are reconstructed from the meaningful eigenspectra to reduce noise and improve the sensitivity for detection of trace element segregation.

引用

页码：195 / 207

页数：13

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