Focused-ion-beam assisted fabrication of individual multiwall carbon nanotube field emitter

被引：26

作者：

Chai, GY

Chow, L ^{[1
]}

Zhou, D

Byahut, SR

机构：

[1] Univ Cent Florida, Dept Phys, Orlando, FL 32816 USA

[2] Monsanto Co, St Louis, MO 63146 USA

[3] Tribhuvan Univ, Cent Dept Phys, Kathmandu, Nepal

来源：

CARBON | 2005年 / 43卷 / 10期

基金：

美国国家科学基金会;

关键词：

carbon nanotubes; focused-ion-beam; field emission;

D O I：

10.1016/j.carbon.2005.03.009

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We report the fabrication of an individual carbon nanotube (CNT) electron field emitter using a focused-ion-beam (FIB) technique. The monolithic multiwall CNT with a graphitic shield is synthesized using chemical vapor deposition technique. The FIB technique is applied to attach the monolithic multiwall CNT on an etched tungsten tip. Field emission measurements arc carried out in a vacuum of 10(-7) Torr. Threshold voltage as low as 120 V has been obtained. (C) 2005 Elsevier Ltd. All rights reserved.

引用

收藏

页码：2083 / 2087

页数：5

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