Field emission from individual multiwalled carbon nanotubes prepared in an electron microscope

被引：43

作者：

de Jonge, N

van Druten, NJ

机构：

[1] Philips Res Labs, NL-5656 AA Eindhoven, Netherlands

[2] Delft Univ Technol, Dept Appl Phys, NL-2628 CJ Delft, Netherlands

来源：

ULTRAMICROSCOPY | 2003年 / 95卷 / 1-4期

关键词：

carbon nanotubes; electron microscope; electron source; field emission;

D O I：

10.1016/S0304-3991(02)00301-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

individual multiwalled carbon nanotube field emitters were prepared in a scanning electron microscope. The angular current density, energy spectra, and the emission stability of the field-emitted electrons were measured. An estimate of the electron source brightness was extracted from the measurements. The results show that carbon nanotubes are promising candidates to replace existing sources in high-resolution electron beam instruments. (C) 2002 Elsevier Science B.V. All rights reserved.

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页码：85 / 91

页数：7

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