Characterization of cobaltite spinels by reflectance spectroscopy

被引：57

作者：

Lefez, B ^{[1
]}

Nkeng, P ^{[1
]}

Lopitaux, J ^{[1
]}

Poillerat, G ^{[1
]}

机构：

[1] UNIV STRASBOURG 1,LAB ELECTROCHIM & CHIM PHYS CORPS SOLIDE,F-67008 STRASBOURG,FRANCE

来源：

MATERIALS RESEARCH BULLETIN | 1996年 / 31卷 / 10期

关键词：

thin films; oxides; infrared spectroscopy;

D O I：

10.1016/0025-5408(96)00122-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The longitudinal (LO) frequencies as well as the transversal (TO) frequencies are determined in a series of cobaltite spinels: Co3O4, ZnCo2O4, MnCo2O4, FeCo2O4, CuCo2O4, and NiCo2O4. The data were obtained from the infrared reflectance spectra of thin layers on cobalt substrate.

引用

页码：1263 / 1267

页数：5

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