Paraxial charge compensator for electron cryomicroscopy

被引:21
作者
Berriman, John A. [1 ]
Rosenthal, Peter B. [1 ]
机构
[1] Natl Inst Med Res, MRC, Div Phys Biochem, London NW7 1AA, England
基金
英国医学研究理事会;
关键词
Cryomicroscopy; Specimen charging; Charge compensation; Transmission electron microscopy; Electrostatic lens; Beam-induced movement; ONE CONDUCTING LAYER; RADIATION-DAMAGE; THIN-FILMS; BIOLOGICAL MACROMOLECULES; CRYOELECTRON MICROSCOPY; STRUCTURAL ORGANIZATION; LOW-TEMPERATURE; SPECIMENS; CONTRAST; IMAGES;
D O I
10.1016/j.ultramic.2012.03.006
中图分类号
TH742 [显微镜];
学科分类号
080401 [精密仪器及机械];
摘要
We describe a multi-hole condenser aperture for the production of several electron beams in the transmission electron microscope (TEM) making it possible to simultaneously image and irradiate spatially separated regions of a specimen. When the specimen is a thin film of vitreous ice suspended over a holey carbon film, simultaneous irradiation of the adjacent carbon support with the off-axis beam compensates for some of the effects of charging in the image formed by a beam irradiating only the ice. Because the intervening region is not irradiated, charge-neutralization of frozen-hydrated specimens can occur by a through-space mechanism such as the emission of secondary electrons from a grounded carbon support film. We use paraxial charge compensation (PCC) to control the amount of charge build-up on the specimen and observe the effects of charge on images. The multi-hole aperture thus provides a tool for investigating the mechanism of charging and charge mitigation during the imaging of radiation sensitive biological specimens by cryomicroscopy. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:106 / 114
页数:9
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