First-principles calculation of intrinsic defect formation volumes in silicon

被引:72
作者
Centoni, SA [1 ]
Sadigh, B
Gilmer, GH
Lenosky, TJ
de la Rubia, TD
Musgrave, CB
机构
[1] San Jose State Univ, Dept Mat Engn, San Jose, CA 95192 USA
[2] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
[3] Ohio State Univ, Columbus, OH 43210 USA
[4] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA
[5] Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA
关键词
D O I
10.1103/PhysRevB.72.195206
中图分类号
T [工业技术];
学科分类号
08 [工学];
摘要
We present an extensive first-principles study of the pressure dependence of the formation enthalpies of all the known vacancy and self-interstitial configurations in silicon, in each charge state from -2 through +2. The neutral vacancy is found to have a formation volume that varies markedly with pressure, leading to a remarkably large negative value (-0.68 atomic volumes) for the zero-pressure formation volume of a Frenkel pair (V+I). The interaction of volume and charge was examined, leading to pressure-Fermi level stability diagrams of the defects. Finally, we quantify the anisotropic nature of the lattice relaxation around the neutral defects.
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页数:9
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