MICROSCOPIC THEORY OF ATOMIC DIFFUSION MECHANISMS IN SILICON

[1] [Anonymous], 1981, POINT DEFECTS SEMICO

[2] SELF-CONSISTENT GREENS FUNCTION CALCULATION OF IDEAL SI VACANCY [J]. PHYSICAL REVIEW LETTERS, 1978, 41 (13) : 892 - 895

[3] THEORY OF THE SILICON VACANCY - AN ANDERSON NEGATIVE-U SYSTEM [J]. PHYSICAL REVIEW B, 1980, 21 (12): : 5662 - 5686

[4] THEORY OF ENHANCED MIGRATION OF INTERSTITIAL ALUMINUM IN SILICON [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (10) : 739 - 742

[5] BARRIER TO MIGRATION OF THE SILICON SELF-INTERSTITIAL [J]. PHYSICAL REVIEW LETTERS, 1984, 52 (13) : 1129 - 1132

[6] SELF-CONSISTENT METHOD FOR POINT-DEFECTS IN SEMICONDUCTORS - APPLICATION TO VACANCY IN SILICON [J]. PHYSICAL REVIEW LETTERS, 1978, 41 (13) : 895 - 899

[7] CAR R, UNPUB

[8] FRANK W, UNPUB DIFFUSION SOLI, V2

[9] FRANK W, 1982, ADV SOLID STATE PHYS, V21

[10] NORM-CONSERVING PSEUDOPOTENTIALS [J]. PHYSICAL REVIEW LETTERS, 1979, 43 (20) : 1494 - 1497

[1] [Anonymous], 1981, POINT DEFECTS SEMICO

[2] SELF-CONSISTENT GREENS FUNCTION CALCULATION OF IDEAL SI VACANCY [J]. PHYSICAL REVIEW LETTERS, 1978, 41 (13) : 892 - 895

[3] THEORY OF THE SILICON VACANCY - AN ANDERSON NEGATIVE-U SYSTEM [J]. PHYSICAL REVIEW B, 1980, 21 (12): : 5662 - 5686

[4] THEORY OF ENHANCED MIGRATION OF INTERSTITIAL ALUMINUM IN SILICON [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (10) : 739 - 742

[5] BARRIER TO MIGRATION OF THE SILICON SELF-INTERSTITIAL [J]. PHYSICAL REVIEW LETTERS, 1984, 52 (13) : 1129 - 1132

[6] SELF-CONSISTENT METHOD FOR POINT-DEFECTS IN SEMICONDUCTORS - APPLICATION TO VACANCY IN SILICON [J]. PHYSICAL REVIEW LETTERS, 1978, 41 (13) : 895 - 899

[7] CAR R, UNPUB

[8] FRANK W, UNPUB DIFFUSION SOLI, V2

[9] FRANK W, 1982, ADV SOLID STATE PHYS, V21

[10] NORM-CONSERVING PSEUDOPOTENTIALS [J]. PHYSICAL REVIEW LETTERS, 1979, 43 (20) : 1494 - 1497