Observation of an HCI-induced nano-dot on an HOPG surface with STM and AFM

被引：40

作者：

Terada, M ^{[1
]}

Nakamura, N

Nakai, Y

Kanai, Y

Ohtani, S

Komaki, K

Yamazaki, Y

机构：

[1] Univ Electrocommun, Inst Laser Sci, Tokyo 1828585, Japan

[2] Univ Tokyo, Grad Sch Arts & Sci, Tokyo 1538902, Japan

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2005年 / 235卷

关键词：

highly charged ions; scanning tunnelling microscopy; ion-surface scattering;

D O I：

10.1016/j.nimb.2005.03.223

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have observed highly oriented pyrolytic graphite (HOPG) irradiated with highly charged ions (HCIs) with a scanning probe microscope. The same impact site was observed with both the scanning tunnelling microscope (STM) and atomic force microscope (AFM) modes. In the non-contact mode AFM image, protrusion-like dots have been observed as well as in the STM observations. The dot size (diameter) and height observed with the AFM mode were nearly equal to that with the STM mode. The present observation clearly indicates that an HCI impact induces topographic modification on an HOPG surface. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：452 / 455

页数：4

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