Electrodeposition of CuInSe2 thin films and their characteristics

Polycrystalline thin films of CuInSe2, (CIS) were deposited by the electrochemical method. Some of the physical properties such as lattice parameters. crystal structure and X-ray data of CuInSe2 (CIS) films with different Cu/In ratios (0.49-1.1) were determined using X-ray diffractometry. A structural transition from chalcopyrite to sphalerite was observed on the electrodeposited CuInSe2 when the compositions of the thin films were varied from a quasi-stoichiometry to indium rich. The surface morphology with different Cu/In ratios was studied using a scanning electron microscope. Quasi-stoichiometric CuInSe2, thin films were obtained in the chalcopyrite structure with grain sizes of the matter of 0.60 mu m. (C) 1999 Elsevier Science B.V. All rights reserved.