Single photon detection with a quantum dot transistor

被引:37
作者
Shields, AJ
O'Sullivan, MP
Farrer, I
Ritchie, DA
Leadbeater, ML
Patel, NK
Hogg, RA
Norman, CE
Curson, NJ
Pepper, M
机构
[1] Toshiba Res Europe Ltd, Cambridge CB4 0WE, England
[2] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2001年 / 40卷 / 3B期
关键词
quantum dot; single photon detector; photo-detector; field effect transistor; semiconductor;
D O I
10.1143/JJAP.40.2058
中图分类号
O59 [应用物理学];
学科分类号
摘要
We propose and demonstrate a type of GaAs/AlGaAs modulation-doped field effect transistor (FET) which is sensitive to single photons. The FET contains a layer of InAs quantum dots formed using an in-situ, self-organising method, adjacent to the channel and separated from it by a thin AlGaAs barrier. Capture of a single photo-excited carrier by a quantum dot leads to a sizeable change in the source-drain current through the transistor, allowing the detection of a single photon. We show this is because the mobility of the electron channel is extremely sensitive to the charge trapped in the dots. This discovery may allow a new type of single photon detector to be developed which does not rely upon avalanche processes.
引用
收藏
页码:2058 / 2064
页数:7
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