X-ray waveguide phenomenon in copper phthalocyanine thin film

被引：6

作者：

Hayashi, K ^{[1
]}

机构：

[1] Tohoku Univ, Mat Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan

来源：

PHYSICA B-CONDENSED MATTER | 2005年 / 357卷 / 1-2期

关键词：

x-ray waveguide; x-ray reflectivity; organic thin film;

D O I：

10.1016/j.physb.2004.11.063

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

A white X-ray beam was irradiated on a copper phthalocyanine (CuPc) thin film under grazing incidence condition, and X-rays propagated in the film due to the waveguide phenomenon were observed by an energy-dispersive detector. Energy profiles of guided X-rays showed four specific resonant modes. By comparing them with the calculated ones, a three-layer model of CuPc film was proposed. (C) 2004 Published by Elsevier B.V.

引用

页码：227 / 231

页数：5