Deep impurity transitions involving cation vacancies and complexes in AlGaN alloys

被引:174
作者
Nam, KB [1 ]
Nakarmi, ML [1 ]
Lin, JY [1 ]
Jiang, HX [1 ]
机构
[1] Kansas State Univ, Dept Phys, Manhattan, KS 66506 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.1943489
中图分类号
O59 [应用物理学];
学科分类号
摘要
Deep ultraviolet (UV) photoluminescence (PL) spectroscopy has been employed to study deep impurity transitions in AlxGa1-xN (0 <= x <= 1) epilayers. Two groups of deep impurity transitions were observed, which are assigned to the recombination between shallow donors and two different deep level acceptors involving cation vacancies (V-cation) and V-cation complexes in AlxGa1-xN alloys. These acceptor levels are pinned to two different energy levels common to AlxGa1-xN alloys (0 <= x <= 1). The deep impurity transitions related with V-cation complexes were observed in AlxGa1-xN alloys between x=0 and 1, while those related with V-cation were only observed in AlxGa1-xN alloys between x=0.58 and 1. This points out to the fact that the formation of V-cation is more favorable in Al-rich AlGaN alloys, while V-cation complexes can be formed in the whole range of x between 0 and 1. The implications of our findings to the UV optoelectronic devices using AlGaN alloys are also discussed. (c) 2005 American Institute of Physics.
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页码:1 / 3
页数:3
相关论文
共 14 条
[1]   Influence of hydrostatic pressure on cation vacancies in GaN, AlN, and GaAs [J].
Gorczyca, I ;
Christensen, NE ;
Svane, A .
PHYSICAL REVIEW B, 2002, 66 (07) :752101-752105
[2]   AlxGa1-xN/GaN band offsets determined by deep-level emission [J].
Hang, DR ;
Chen, CH ;
Chen, YF ;
Jiang, HX ;
Lin, JY .
JOURNAL OF APPLIED PHYSICS, 2001, 90 (04) :1887-1890
[3]   Properties of the yellow luminescence in undoped GaN epitaxial layers [J].
Hofmann, DM ;
Kovalev, D ;
Steude, G ;
Meyer, BK ;
Hoffmann, A ;
Eckey, L ;
Heitz, R ;
Detchprom, T ;
Amano, H ;
Akasaki, I .
PHYSICAL REVIEW B, 1995, 52 (23) :16702-16706
[4]   Time-resolved photoluminescence studies of AlxGa1-xN alloys [J].
Kim, HS ;
Mair, RA ;
Li, J ;
Lin, JY ;
Jiang, HX .
APPLIED PHYSICS LETTERS, 2000, 76 (10) :1252-1254
[5]   III-nitride ultraviolet light-emitting diodes with delta doping [J].
Kim, KH ;
Li, J ;
Jin, SX ;
Lin, JY ;
Jiang, HX .
APPLIED PHYSICS LETTERS, 2003, 83 (03) :566-568
[6]   DEEP-LEVEL IMPURITIES - A POSSIBLE GUIDE TO PREDICTION OF BAND-EDGE DISCONTINUITIES IN SEMICONDUCTOR HETEROJUNCTIONS [J].
LANGER, JM ;
HEINRICH, H .
PHYSICAL REVIEW LETTERS, 1985, 55 (13) :1414-1417
[7]   Band-edge photoluminescence of AIN epilayers [J].
Li, J ;
Nam, KB ;
Nakarmi, ML ;
Lin, JY ;
Jiang, HX .
APPLIED PHYSICS LETTERS, 2002, 81 (18) :3365-3367
[8]   Point-defect complexes and broadband luminescence in GaN and AlN [J].
Mattila, T ;
Nieminen, RM .
PHYSICAL REVIEW B, 1997, 55 (15) :9571-9576
[9]   Transport properties of highly conductive n-type Al-rich AlxGa1-xN (x≥0.7) [J].
Nakarmi, ML ;
Kim, KH ;
Zhu, K ;
Lin, JY ;
Jiang, HX .
APPLIED PHYSICS LETTERS, 2004, 85 (17) :3769-3771
[10]   Deep ultraviolet picosecond time-resolved photoluminescence studies of AlN epilayers [J].
Nam, KB ;
Li, J ;
Nakarmi, ML ;
Lin, JY ;
Jiang, HX .
APPLIED PHYSICS LETTERS, 2003, 82 (11) :1694-1696