Angle-resolved XPS measurements on copper phthalocyanine thin films

被引：26

作者：

Adolphi, B ^{[1
]}

Berger, O ^{[1
]}

Fischer, WJ ^{[1
]}

机构：

[1] TU Dresden, Semicond & Microsyst Technol Lab, D-01062 Dresden, Germany

来源：

APPLIED SURFACE SCIENCE | 2001年 / 179卷 / 1-4期

关键词：

XPS; organic layer; valence band spectra; chemical states;

D O I：

10.1016/S0169-4332(01)00270-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Copper phthalocyanine films about 100 nm in thickness were produced by vacuum sublimation. Different heat treatments transformed the layer from the starting alpha- to the beta -structure. The chemical states or the layer were characterized by XPS during this transformation. The measurements from core level peaks and the valence band spectra showed systematic changes. At temperatures above 300 degreesC the Cu detached itself from the chemical bonds in the molecule, the aromatic share of the carbon decreased and new C-N bonds were formed. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：102 / 108

页数：7

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