Semiconductor pixel detectors for digital mammography

被引:11
作者
Novelli, M
Amendolia, SR
Bisogni, MG
Boscardin, M
Dalla Betta, GF
Delogu, P
Fantacci, ME
Quattrocchi, M
Rosso, V
Stefanini, A
Venturelli, L
Zucca, S
机构
[1] Univ Pisa, Dipartimento Fis, I-56100 Pisa, Italy
[2] Sezione Ist Nazl Fis Nucl, I-56100 Pisa, Italy
[3] Univ Sassari, Ist Matemat & Fis, Pisa, Italy
[4] ITC Irst, Div Microsist, Trento, Italy
[5] Univ Trent, Dipartimento Informat & Telecommun, Trento, Italy
[6] Univ Naples, Dipartimento Fis, Pisa, Italy
[7] Alenia Marconi Syst SpA, Rome, Italy
关键词
medical imaging; GaAs; Si pixel detectors;
D O I
10.1016/S0168-9002(03)01639-5
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 [仪器科学与技术]; 080401 [精密仪器及机械]; 081102 [检测技术与自动化装置];
摘要
We present some results obtained with silicon and gallium arsenide pixel detectors to be applied in the field of digital mammography. Even though GaAs is suitable for medical imaging applications thanks to its atomic number, which allows a very good detection efficiency, it often contains an high concentrations of traps which decrease the charge collection efficiency (CCE). So we have analysed both electrical and spectroscopic performance of different SI GaAs diodes as a function of concentrations of dopants in the substrate, in order to find a material by which we can obtain a CCE allowing the detection of all the photons that interact in the detector. Nevertheless to be able to detect low contrast details, efficiency and CCE are not the only parameters to be optimized; also the stability of the detection system is fundamental. In the past we have worked with Si pixel detectors; even if its atomic number does not allow a good detection efficiency at standard thickness, it has a very high stability. So keeping in mind the need to increase the Silicon detection efficiency we performed simulations to study the behaviour of the electrical potential in order to find a geometry to avoid the risk of electrical breakdown. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:283 / 289
页数:7
相关论文
共 12 条
[1]
PERFORMANCE OF A NEW OHMIC CONTACT FOR GAAS PARTICLE DETECTORS [J].
ALIETTI, M ;
CANALI, C ;
CASTALDINI, A ;
CAVALLINI, A ;
CETRONIO, A ;
CHIOSSI, C ;
DAURIA, S ;
DELPAPA, C ;
LANZIERI, C ;
NAVA, F ;
VANNI, P .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1995, 362 (2-3) :344-348
[2]
GaAs detector optimization for different medical imaging applications [J].
Amendolia, SR ;
Bertolucci, E ;
Bisogni, MG ;
Bottigli, U ;
Ciocci, MA ;
Conti, M ;
Delogu, P ;
Fantacci, ME ;
Maestro, P ;
Marzulli, V ;
Pernigotti, E ;
Romeo, N ;
Rosso, V ;
Russo, P ;
Stefanini, A ;
Stumbo, S .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1999, 434 (01) :14-17
[3]
Low contrast imaging with a GaAs pixel digital detector [J].
Amendolia, SR ;
Bisogni, MG ;
Bottigli, U ;
Ciocci, MA ;
Delogu, P ;
Dipasquale, G ;
Fantacci, ME ;
Giannelli, M ;
Maestro, P ;
Marzulli, VM ;
Pernigotti, E ;
Rosso, V ;
Stefanini, A ;
Stumbo, S .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2000, 47 (04) :1478-1482
[4]
AMENDOLIA SR, P IEEE NUCL SCI S ME
[5]
AMENDOLIA SR, 2001, P INT WORKSH ROOM TE
[6]
BETTA GFD, 2001, NUCL INSTRUM METH A, V460, P303
[7]
Performance of a 4096 pixel photon counting chip [J].
Bisogni, MG ;
Campbell, M ;
Conti, M ;
Delogu, P ;
Fantacci, ME ;
Heijne, EHM ;
Maestro, P ;
Magistrati, G ;
Marzulli, VM ;
Meddeler, G ;
Mikulec, B ;
Pernigotti, E ;
Rosso, V ;
Schwarz, C ;
Snoeys, W ;
Stumbo, S ;
Watt, J .
EUV, X-RAY, AND GAMMA-RAY INSTRUMENTATION FOR ASTRONOMY IX, 1998, 3445 :298-304
[8]
A readout chip for a 64 x 64 pixel matrix with 15-bit single Photon Counting [J].
Campbell, M ;
Heijne, EHM ;
Meddeler, G ;
Pernigotti, E ;
Snoeys, W .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (03) :751-753
[9]
Study of breakdown effects in silicon multiguard structures [J].
Da Rold, M ;
Bacchetta, N ;
Bisello, D ;
Paccagnella, A ;
Dalla Betta, GF ;
Verzellesi, G ;
Militaru, O ;
Wheadon, R ;
Fuochi, PG ;
Bozzi, C ;
Dell'Orso, R ;
Messineo, A ;
Tonelli, G ;
Verdini, PG .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1999, 46 (04) :1215-1223
[10]
*ISE INT SYST ENG, 1999, DESSIS6 0 REF MAN