Test results on silicon micro-strip detectors for ATLAS

被引:6
作者
DeWitt, J
Dorfan, DE
Dubbs, T
Grillo, AA
Kashigin, S
Kroeger, W
Pulliam, T
Rahn, J
Rowe, WA
Sadrozinski, HFW
Seiden, A
Spencer, E
Webster, A
Wichmann, R
Wilder, M
Williams, DC
Dane, J
Lankford, A
Pier, S
Schmid, B
Bonino, R
Couyoumtzelis, C
Demierre, P
Fujita, K
Handa, T
Iwata, Y
Ohsugi, T
Iwasaki, H
Kohriki, T
Kondo, T
Terada, S
Unno, Y
Takashima, R
Ciocio, A
Collins, T
Emes, J
Gilchriese, MGD
Haber, C
Kipnis, I
Shapiro, M
Siegrist, J
Spieler, H
Moorhead, G
Nakao, M
Tamura, N
Dabrowski, W
Idzik, M
Godlewski, J
Grewal, A
Nickerson, R
机构
[1] UNIV CALIF SANTA CRUZ,SANTA CRUZ INST PARTICLE PHYS,SANTA CRUZ,CA 95064
[2] UNIV CALIF IRVINE,IRVINE,CA 92717
[3] UNIV GENEVA,GENEVA,SWITZERLAND
[4] HIROSHIMA UNIV,HIROSHIMA,JAPAN
[5] KEK,TSUKUBA,IBARAKI,JAPAN
[6] KYOTO UNIV,KYOTO,JAPAN
[7] LAWRENCE BERKELEY LAB,BERKELEY,CA
[8] UNIV MELBOURNE,MELBOURNE,VIC,AUSTRALIA
[9] OKAYAMA UNIV,OKAYAMA 700,JAPAN
[10] IPNT,KRAKOW,POLAND
[11] INP,KRAKOW,POLAND
[12] UNIV OXFORD,OXFORD,ENGLAND
[13] UNIV WISCONSIN,MADISON,WI
关键词
D O I
10.1016/S0168-9002(96)01105-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We report results from beam tests on silicon microstrip detectors using a binary readout system for ATLAS. The data were collected during the 1-18 beam test at CERN in August/September 1995 and the KEK test in February 1996. The binary modules tested had been assembled from silicon microstrip detectors of different layout and from front-end electronics chips of different architecture. The efficiency, noise occupancy and position resolution were determined as a function of the threshold setting for various bias voltages and angles of incidence for both irradiated and non-irradiated detectors. In particular, the high spatial resolution of the beam telescope allowed the evaluation of the performance as a function of the track location in between detector strips.
引用
收藏
页码:122 / 128
页数:7
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