Analysis of the interfaces of [NiFe/Mo]30 and [Fe/Mo]30 multilayers

被引：4

作者：

Luo, GM

Jiang, HW

Wu, F

Yan, ML

Mai, ZH

Lai, WY

Dong, C

Wang, YT

机构：

[1] Chinese Acad Sci, Inst Phys, Beijing 100080, Peoples R China

[2] Chinese Acad Sci, Ctr Condensed Matter Phys, Beijing 100080, Peoples R China

[3] Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1999年 / 11卷 / 04期

关键词：

D O I：

10.1088/0953-8984/11/4/002

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The interface states of [NiFe/Mo](30) and [Fe/Mo](30) multilayers have been investigated by x-ray small angle reflection and diffuse scattering. Significant interface roughness correlation was observed in both ultrathin [NiFe/Mo](30) and [Fe/Mo](30) multilayers. An uncorrelated roughness of about 27-3.1 Angstrom was revealed in the [NiPe/Mo](30) multilayers, which is explained as originating from a transition layer between the NiFe and the Mo layers. By the technique of diffuse scattering, it is clearly indicated that the interfacial roughness of NiFe/Mo is much smaller than that of Fe/Mo although the lattice mismatch is the same in both multilayers.

引用

页码：945 / 954

页数：10

共 15 条

[1] STRUCTURAL REFINEMENT OF SUPERLATTICES FROM X-RAY-DIFFRACTION [J].

FULLERTON, EE ;

SCHULLER, IK ;

VANDERSTRAETEN, H ;

BRUYNSERAEDE, Y .

PHYSICAL REVIEW B, 1992, 45 (16) :9292-9310

[2] ROUGHNESS AND GIANT MAGNETORESISTANCE IN FE/CR SUPERLATTICES [J].

FULLERTON, EE ;

KELLY, DM ;

GUIMPEL, J ;

SCHULLER, IK ;

BRUYNSERAEDE, Y .

PHYSICAL REVIEW LETTERS, 1992, 68 (06) :859-862

[3] X-RAY REFLECTION FROM ROUGH LAYERED SYSTEMS [J].

HOLY, V ;

KUBENA, J ;

OHLIDAL, I ;

LISCHKA, K ;

PLOTZ, W .

PHYSICAL REVIEW B, 1993, 47 (23) :15896-15903

[4] NONSPECULAR X-RAY REFLECTION FROM ROUGH MULTILAYERS [J].

HOLY, V ;

BAUMBACH, T .

PHYSICAL REVIEW B, 1994, 49 (15) :10668-10676

[5]

LI M, 1994, J APPL PHYS, P20

[6] Structural studies of NixFe100-x/Mo magnetic multilayers by x-ray small-angle reflection and high-angle diffraction [J].

Luo, GM ;

Yan, ML ;

Mai, ZH ;

Lai, WY ;

Wang, YT .

PHYSICAL REVIEW B, 1997, 56 (06) :3290-3295

[7] EFFECT OF ANNEALING ON INTERFACE STRUCTURE AND GIANT MAGNETORESISTANCE OSCILLATION IN CO/CU MULTILAYERS [J].

NAWATE, M ;

INAGE, K ;

IMADA, R ;

ITOGAWA, M ;

HONDA, S .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (6A) :3082-3087

[8]

PARKIN SSP, 1994, ULTRATHIN MAGNETIC S, V2, P149

[9] SURFACE STUDIES OF SOLIDS BY TOTAL REFLECTION OF X-RAYS [J].

PARRATT, LG .

PHYSICAL REVIEW, 1954, 95 (02) :359-369

[10] DETERMINATION OF ROUGHNESS CORRELATIONS IN MULTILAYER FILMS FOR X-RAY MIRRORS [J].

SAVAGE, DE ;

KLEINER, J ;

SCHIMKE, N ;

PHANG, YH ;

JANKOWSKI, T ;

JACOBS, J ;

KARIOTIS, R ;

LAGALLY, MG .

JOURNAL OF APPLIED PHYSICS, 1991, 69 (03) :1411-1424

← 1 2 →